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Process capability analysis of non-normal process data using the Burr XII distribution

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Abstract

This paper proposes a novel modification of Clements’s method using the Burr XII distribution to improve the accuracy of estimates of indices associated with one-sided specification limits for non-normal process data. This work proposes a novel Burr-based method, and compares it with Clements’s method by simulation. Finally, an example application to semiconductor manufacturing is presented.

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Authors and Affiliations

  1. Department of Industrial Engineering and Engineering Management, National Tsing Hua University, Hsinchu, Taiwan

    Pei-Hsi Liu & Fei-Long Chen

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  1. Pei-Hsi Liu
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  2. Fei-Long Chen
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Correspondence to Fei-Long Chen.

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Liu, PH., Chen, FL. Process capability analysis of non-normal process data using the Burr XII distribution. Int J Adv Manuf Technol 27, 975–984 (2006). https://doi.org/10.1007/s00170-004-2263-8

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  • DOI: https://doi.org/10.1007/s00170-004-2263-8

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