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Measurement of Ethylene Concentrations at High Pressure Based on Tunable Diode Laser Absorption Spectroscopy near 1620 nm

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Journal of Applied Spectroscopy Aims and scope

A system for detection of ethylene (C2H4) at high pressure is developed based on tunable diode laser absorption spectroscopy using a distributed feedback laser near 1620 nm. To eliminate the influence of spectral line overlap under high pressure, a differential absorption (peak-minus-valley) scheme is adopted. The peak and valley wavelengths used for the measurement correspond to 6174.64 and 6174.45 cm–1, respectively. Absorption cross sections of ethylene are measured for the selected peak and valley wavelengths. The measured concentration agrees with the known concentration, and the maximum of the standard deviation is 0.746% for all measurements. In addition, long-term continuous measurements indicated good stability of the system. The sensitivity of the system is ~18 ppm with an optimum averaging time of 110 s. All the experimental results validate the applicability of the system in ethylene trace detection.

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Authors and Affiliations

  1. College of Physics and Electronic Engineering, Jiangsu Normal University, Xuzhou, China

    T. Zhang, G. Zhang, X. Liu, G. Gao & T. Cai

Authors
  1. T. Zhang
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  2. G. Zhang
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  3. X. Liu
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  4. G. Gao
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  5. T. Cai
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Correspondence to T. Cai.

Additional information

Published in Zhurnal Prikladnoi Spektroskopii, Vol. 87, No. 4, pp. 617–622, July–August, 2020.

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Zhang, T., Zhang, G., Liu, X. et al. Measurement of Ethylene Concentrations at High Pressure Based on Tunable Diode Laser Absorption Spectroscopy near 1620 nm. J Appl Spectrosc 87, 674–679 (2020). https://doi.org/10.1007/s10812-020-01053-8

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  • DOI: https://doi.org/10.1007/s10812-020-01053-8

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