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The Use of Software Engineering Methods for Efficacious Test Program Creation: A Supportive Evidence Based Case Study

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Abstract

Within the semiconductor manufacturing chain the automated testing steps are coming increasingly into focus. Delivering enhanced functionality per IC is expected, with the costs per die being reduced, while, at the same time, the costs of semiconductor electrical tests increase disproportionately. In addition, the requirements for quality are significantly growing, in general, and in particular, being ensured by automated testing. Hence, the execution of test development and test method quality are becoming an important, competitive-advantage topic. This paper presents a case study that evidences such advantage by adopting software engineering methodologies in test program generation. A software cost model applied to test program development parameters, assessed in combination with Bayesian analysis and Gaussian statistical methods, is discussed in detail. Furthermore, the results obtained indicate the effectiveness of the proposed approach, evidencing a remarkable effort reduction, and address quality robustness in semiconductor test engineering.

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Author notes

  1. Stefan Vock

    Present address: Infineon Technologies AG, Am Campeon 1-12, 85579, Neubiberg, Germany

Authors and Affiliations

  1. Faculty of Computing and Engineering, University of Ulster, Shore Road, Newtownabbey, Co. Antrim, BT37 0QB, UK

    Stefan Vock

  2. Engineering Research Institute, School of Engineering, University of Ulster, Shore Road, Newtownabbey, Co. Antrim, BT37 0QB, UK

    Omar Escalona, Colin Turner & Frank Owens

Authors
  1. Stefan Vock
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  2. Omar Escalona
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  3. Colin Turner
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  4. Frank Owens
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Corresponding author

Correspondence to Stefan Vock.

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Responsible Editor: Y. Zorian

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Vock, S., Escalona, O., Turner, C. et al. The Use of Software Engineering Methods for Efficacious Test Program Creation: A Supportive Evidence Based Case Study. J Electron Test 30, 457–467 (2014). https://doi.org/10.1007/s10836-014-5462-8

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  • DOI: https://doi.org/10.1007/s10836-014-5462-8

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