Abstract
In our proposed Atomic Force Microscopy combined with Tip-Enhanced Raman Spectroscopy (AFM-TERS) system, the intensity of the local electric field significantly increased by designing a grating structure on the tip of the system. Using Finite Difference Time Domain method, stimulation of surface plasmons and electron densities are done to determine the electric field around the tips of gold and silver cones. First, the geometric grating parameters are optimized to have the highest intensity of the electric field at the tip apex. Then, the distance of tip apex from the sample molecule and also the light source specifications are determined so that the highest field intensity is induced at the tip apex. To optimize the system operation the Particle Swarm Optimization algorithm is used at all stages. Among the parameters, the incident angle is the most effective one on increasing the electric field strength and quality factor of the spectral response of the enhancement factor. We also noticed that by applying an appropriate grating on the cone surface, the quality factor of the spectral response of our AFM-TERS system increases significantly. Finally, using two laser sources on both sides of the tip increases the amount of enhancement factor effectively. The optimized amounts of enhancement factors at the apex of the gold and silver tips are obtained as 3.11 × 109 and 3.79 × 109 respectively, where these values are much greater than those reported earlier. The results show a noticeable improvement in the performance of the proposed AFM-TERS system.
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Katebi Jahromi, M., Ghayour, R. & Adelpour, Z. Modeling electric field increment in the Tip-Enhanced Raman Spectroscopy by using grating on the probe of atomic force nanoscope. Opt Quant Electron 53, 385 (2021). https://doi.org/10.1007/s11082-021-03051-2
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DOI: https://doi.org/10.1007/s11082-021-03051-2