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A new approach to select the reliable suppliers for one-shot devices

  • Production Management
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A Correction to this article was published on 13 March 2021

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Abstract

A one-shot device is referred to as a unit that performs its function only once, hence a one-shot device cannot be used for testing more than once. Missiles, airbags of automobiles, magnetorheological fluids, and thermal batteries are some examples of one-shot devices. Usually, one-shot devices are kept in storage or in the stand-by condition and taken into use when required. As a matter of fact, proper operation of such devices at designated times becomes an important issue. Thus, choosing appropriate and reliable suppliers of one-shot devices in preventive maintenance periods can be regarded as a critical measure. This paper presents a new approach to provide resilience in supplier selection for one-shot devices and its subsystems in response to risks. In this research: (1) an expert team is set up having experience and expertise in one-shot systems, (2) risks of suppliers are estimated using satisfying and simple additive weighting (SAW) methods, (3) risk related to each equipment are determined by a cause and effect matrix, (4) after presenting a novel integrated approach, the best combination for one-shot equipment suppliers is selected by using fault tree analysis, (5) finally, to evaluate the performance of the proposed approach, a real case study is also used. This approach can therefore be used for determining faults in the entire system evaluated along with allocating suppliers to each equipment by considering suppliers and equipment risks as well as making and selecting scenarios.

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Data availability

Some or all data, models, or code that support the findings of this study are available from the corresponding author.

Change history

Abbreviations

MADM:

Multi-attribute decision making

FTA:

Fault tree analysis

SAW:

Simple additive weighting

SPM:

Scheduled preventive maintenance

RBD:

Reliability block diagram

DEA:

Data envelopment analysis

FIS:

Fuzzy inference system

QFD:

Quality function deployment

CBR:

Case-based reasoning

DSS:

Decision support system

FMEA:

Failure mode and effect analysis

GT:

Group technology

Si :

Total score for the ith supplier

Wj :

weight of the jth attribute (Index)

Sij :

Score of the ith supplier relative to the jth attribute

Ri :

Risk score assigned to the ith supplier

Yj :

The maximum imaginable score for each supplier in the jth attribute

RSk :

Intrinsic risk of the kth subset

SWkz :

Weight of the kth subset in relative to occurrence of the zth top event

EWz :

Weight of the zth top event

MRSk :

Modified risk for the kth subset when it is supplied from the ith supplier

CRz :

Critical level of top event z

Pz :

Probability of the top event z

Lz :

Damage inflicted by the top event z

TR:

Total risk of one-shot system

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Authors and Affiliations

  1. Industrial Engineering Department, Maleke-Ashtar University of Technology, Tehran, Iran

    Meysam Azimian & Karim Atashgar

  2. Industrial Engineering Department, Maleke-Ashtar University of Technology, Isfahan, Iran

    Mahdi Karbasian

  3. Industrial Systems Engineering, University of Regina, Regina, SK, Canada

    Golam Kabir

Authors
  1. Meysam Azimian
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  2. Mahdi Karbasian
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  3. Karim Atashgar
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  4. Golam Kabir
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Correspondence to Golam Kabir.

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Azimian, M., Karbasian, M., Atashgar, K. et al. A new approach to select the reliable suppliers for one-shot devices. Prod. Eng. Res. Devel. 15, 371–382 (2021). https://doi.org/10.1007/s11740-021-01032-8

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