Abstract
Results are presented from structural and electrochemical researches on C60 films. The fullerite films were made by thermal vacuum evaporation and deposition on NaCl crystals. The substrate temperatures were 293-473 K. The examinations were made in a transmission electron microscope at 100 kV and by x-ray diffraction. Dark-field images were obtained from the individual fullerite particles and particularly from grains in continuous thin films, which showed stacking faults or twin boundaries. The numbers of these defects increase with the substrate temperature. The x-ray diffraction patterns of the fullerite films show extremely diffuse reflections together with a weak reflection around the FCC (111), which may be assigned to a hexagonal close packed HCP modification of fullerite. Rietveld's method was used in processing the x-ray patterns. The best fit between the experimental and theoretical diffraction lines was obtained with the following structure parameters: ratio of FCC phase (a = 1.4117 nm) and HCP phase (a = 0.9756 nm and c = 1.7084 nm) was 46/54 mass%. The electrochemical data indicate that a palladium-activated fullerite film shows prominent hysteresis, which confirms that certain hydride phases are formed at the surface of the C60 film.
Similar content being viewed by others
References
V. I. Trefilov, D. V. Shchur, and B. P. Tarasov, Fullerenes as the Basis for Future Materials [in Russian], ADEF-Ukraina, Kiev (2001).
A. V. Eletskii and B. M. Smirnov, “The fullerenes,” Usp. Fiz. Nauk., 163,No.2, 33-59 (1993).
W. Krätschmer, Z. D. Lamb, K. Fostiropolous, and D. R. Huffman, Nature, 347, 354 (1991).
J. E. Fischer, “Structure and dynamics of solid C60 and its intercalation compounds,” Mat. Sci. Eng., B19, 90-99(1993)
R. Z. Bakhtizin, T. Hashitsume, S. D. Wong, and T. Sakurai, “Scanning tunneling microscopy of fullerenes on metals and semiconductors,” Usp. Fiz. Nauk., 167,No. 3, 289-307 (1997).
M. I. Attala, A. M. Vassallo, B. N. Tattam, and J. V. Hanna, “Preparation of hydrofullerenes by hydrogen radical induced hydrogenation,” J. Phys. Chem., 97,No.24, 6329-6331 (1993).
Z. E. Hall, D. R. McKenzie, R. Z. Davis, et al., “Structural determination of the hydrofullerene C60D36 by neutron diffraction,” Acta Cryst., B54, 345-350 (1998).
Y. Saito, T. Yoshikawa, and Y. Ishikawa, “Electron microscopy of fullerene thin films grown on solid surfaces,” Mat. Sci. Eng., B19, 18-24 (1993).
T. Ichihashi, K. Tanigaki, T. W. Ebbesen, et al., Chem. Phys. Lett., 190, 179 (1992).
L. M. Utevskii, Diffraction Electron Microscopy in Materials Science [in Russian], Metallurgiya, Moscow (1973).
L. D. Landau and E. M. Lifshits, Theory of Elasticity [in Russian], Nauka, Moscow (1965).
L. S. Palatnik, M. Ya. Fuks, and V. M. Kosevich, Condensed-Film Formation Mechanisms and Substructures [in Russian], Nauka, Moscow (1972).
Ya. D. Vishnyakov, Stacking Faults in Crystal Structure [in Russian], Metallurgiya, Moscow (1970).
V. V. Skorokhod and Yu. M. Solonin, Stacking Faults in Transition Metals [in Russian], Nauk. Dumka, Kiev (1976).
B. I. Nikolin, “Crystal structures and formation principles for multilayer martensite structures,” in: Martensite Transformations: Papers at the ICOMAT-77 International Conference, Kiev, 16-20 May 1977 [in Russian], Nauk. Dumka, Kiev (1978), pp. 123-128.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Solonin, Y.M. Structure and Electrochemical Activity of C60 Fullerite Films. Powder Metallurgy and Metal Ceramics 40, 618–624 (2001). https://doi.org/10.1023/A:1015292222589
Issue Date:
DOI: https://doi.org/10.1023/A:1015292222589