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First results of the application of scanning XRF analysis with synchrotron-radiation beams from the VEPP-3 to study the spatial distribution of trace elements in samples of stratiform chromite ores

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Abstract

A sample from chromite horizon UG1 of the platiniferous Bushveld complex (South Africa) is studied by scanning X-ray fluorescence (XRF) microanalysis using synchrotron-radiation beams from the VEPP-3 storage ring. The sample contains plagioclase and chromite layers 3–5 mm in thickness. The experimental study is conducted at excitation energies of 15 and 30 keV; the spot size of the excitation radiation is 0.1 ± 2 mm; and the scanning step is 100 µm. The distribution profiles of more than 20 trace elements over the surface of the sample are obtained.

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Correspondence to A. V. Darin.

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Original Russian Text © A.V. Darin, I.V. Veksler, Ya.V. Rakshun, 2016, published in Poverkhnost’. Rentgenovskie, Sinkhrotronnye i Neitronnye Issledovaniya, 2016, No. 1, pp. 60–63.

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Darin, A.V., Veksler, I.V. & Rakshun, Y.V. First results of the application of scanning XRF analysis with synchrotron-radiation beams from the VEPP-3 to study the spatial distribution of trace elements in samples of stratiform chromite ores. J. Surf. Investig. 10, 88–91 (2016). https://doi.org/10.1134/S1027451016010092

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  • DOI: https://doi.org/10.1134/S1027451016010092

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