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Microstructure-Controlled Multilayer PZT Actuators: Effects of Cyclic Actuation on Crystallographic Structure

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Abstract

In this study, multilayered PbTixZr1-xO3 (PZT) samples (produced at sintering temperatures in the range of 1175 °C to 1325 °C) were electrically fatigued by long-term exposure (∼106 cycles) to electric fields, and the parameters of initial and remnant polarization were estimated. Changes in the crystallographic microstructure as a function of sintering temperature Ts were examined by scanning electron microscopy (SEM) and X-ray diffraction (XRD) to gain insight on fatigue mechanisms and their prevention. Results showed that domain wall movement was facilitated in samples processed at TS less than 1250 °C, and that such samples were more resistant to electrical fatigue.

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Authors and Affiliations

  1. Materials Reliability Division, National Institute of Standards & Technology (NIST), 325 Broadway, 80305-3328, Boulder, CO, USA

    Jens Müller, A. Hooker Stephanie & Davor Balzar

  2. Department of Physics and Astronomy, University of Denver, 80208, Denver, CO, USA

    Davor Balzar

Authors
  1. Jens Müller
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  2. A. Hooker Stephanie
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  3. Davor Balzar
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Müller, J., Stephanie, A.H. & Balzar, D. Microstructure-Controlled Multilayer PZT Actuators: Effects of Cyclic Actuation on Crystallographic Structure. MRS Online Proceedings Library 888, 803 (2005). https://doi.org/10.1557/PROC-0888-V08-03

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  • DOI: https://doi.org/10.1557/PROC-0888-V08-03

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