Abstract
The correlations in multi-modal microscopy data can be systematically reduced by the distinct probe-sample interactions and signal collection geometry for each modality. Extracting scientific insights from correlative datasets thus requires careful consideration of the mode-specific, and often non-overlapping, sampling volume used in the correlative microscopy. Here we describe a pencil beam, ray tracing method that accounts for the finite extent and roughness of thin-films and nanomaterials in synchrotron-based X-ray microscopy measurements, creating a first approximation of the probe-sample interaction for each modality that tightens correlations in multi-modal X-ray nanoprobe characterization. As a demonstrative example we analyze structure–function correlations in sequential microscopy data acquired for a Eu:CsPbBr3 halide perovskite thin-film crystal across three distinct measurement modes. Our ray-traced corrections account for local fluorescence matrix effects and sampling volume discrepancies and unveil structural, compositional, and optoelectronic relationships hidden in the raw data.
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Data Availability
The datasets generated during and/or analyzed during the current study are available from the corresponding author on reasonable request.
Code Availability
The code described in this work is available at https://github.com/rekumar/XRayTracer.
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Acknowledgments
Thank you to Moses Kodur at UC San Diego for his help in taking the μPL data, and to Tao Zhou, Martin V. Holt, and Zhonghou Cai from the Center for Nanoscale Materials at Argonne National Laboratory for their assistance during and valuable discussion about our synchrotron measurements. This work was supported in part by the National Science Foundation under Grant No. DMR-1848371. Use of the Center for Nanoscale Materials and the Advanced Photon Source, both Office of Science user facilities, was supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357. This work was performed in part at the San Diego Nanotechnology Infrastructure (SDNI) of UCSD, a member of the National Nanotechnology Coordinated Infrastructure, which was supported by the National Science Foundation (Grant ECCS-1542148).
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Kumar, R.E., Quinn, X.L. & Fenning, D.P. Accounting for sample morphology in correlative X-ray microscopy via ray tracing. MRS Advances 6, 547–553 (2021). https://doi.org/10.1557/s43580-021-00114-0
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DOI: https://doi.org/10.1557/s43580-021-00114-0