Abstract
A method of synthesis of irredundant circuits of functional elements in the basis {x&y, x⊕y, 1, \(\bar x\)(y ∨ z) ∨ x(y ∼ z)} realizing arbitrary Boolean functions and admitting unit verification tests of the length not exceeding 4 is proposed in the paper for inverse or constant (stuck-at) faults at outputs of gates.
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References
N. P. Red’kin, Reliability and Diagnostics of Circuits (Moscow State Univ., Moscow, 1992) [in Russian].
S. M. Reddy, “Easily Testable Realization for Logic Functions,” IEEE Trans. Comput. 21(1), 124 (1972).
N. P. Red’kin, “Circuits Admitting Short Tests,” Vestn. Mosk. Univ., Matem. Mekhan., No. 2, 17 (1988).
S. V. Kovatsenko, “Synthesis of Easily Tested Circuits in Zhegalkin Basis for Inverse Faults,” Vestn. Mosk. Univ., Vychisl. Matem. Kibern., No. 2, 45 (2000).
N. P. Red’kin, “Unit Verification Tests for Circuits with Inverse Faults of Elements,” in Mathematical Problems of Cybernetics (Fizmatlit, Moscow, 2003), Vol. 12, pp. 217–230.
Yu. V. Borodina, “Synthesis of Easily Tested Circuits in the Case of Single-Type Constant Faults at Outputs of Elements,” Vestn. Mosk. Univ., Vychisl. Matem. Kibern., No. 1, 40 (2008).
Yu. V. Borodina, Circuits Admitting Single-Fault Tests of Length 1 under Constant Faults at Outputs of Elements,“ Vestn. Mosk. Univ., Matem. Mekhan., No. 5, 49 (2008).
Yu. V. Borodina and P. A. Borodin, “Synthesis of Easily Tested Circuits in the Zhegalkin Basis under Constant Faults of Type “0” at Outputs of Elements,” Diskret. Matem. 22(3), 127 (2010).
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Original Russian Text © D.S. Romanov, 2012, published in Vestnik Moskovskogo Universiteta, Matematika. Mekhanika, 2012, Vol. 67, No. 2, pp. 24–29.
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Romanov, D.S. A method for synthesis of easily-testable circuits in some basis admitting single fault detection tests of constant length. Moscow Univ. Math. Bull. 67, 69–73 (2012). https://doi.org/10.3103/S0027132212020064
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DOI: https://doi.org/10.3103/S0027132212020064