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TEM for Characterization of Semiconductor Nanomaterials

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Transmission Electron Microscopy Characterization of Nanomaterials

Abstract

Transmission electron microscopy provides a wide range of methods to study the morphology, the crystal structure and perfection, the chemistry, and the magnetic and the electronic properties of the matter at the highest spatial resolution. In this chapter some TEM approaches to study nanostructured semiconductors will be described with the help of practical examples of their application to different kinds of material systems.

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Acknowledgments

I would like to thank Alfonso Franciosi for the many inspiring discussions, Regina Ciancio for the careful reading of the paper and Ezio Cociancich for the help in the realization of some of the figures of the chapter.

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  1. Centro di Microscopia Elettronica – Consiglio Nazionale delle Ricerche – Istituto di Officina dei Materiali (CNR-IOM-TASC), Blg. MM Area Science Park Basovizza – SS 14, 34149, Trieste, Italy

    Elvio Carlino

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  1. Center for Advanced Microstructures and Devices, Baton Rouge, Louisiana, USA

    Challa S.S.R. Kumar

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Carlino, E. (2014). TEM for Characterization of Semiconductor Nanomaterials. In: Kumar, C. (eds) Transmission Electron Microscopy Characterization of Nanomaterials. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-38934-4_3

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