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Bright-Pixel Defects in Irradiated CCD Image Sensors

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Abstract

We have examined environmental radiation sources for digital cameras to find the origins of bright-pixel defects known to accumulate with time. We show that beta and gamma emissions from camera parts and lenses cause image transients, but permanent damage can occur with alpha particles from the CCD cover glass. Our experiments with 14-MeV- and thermal-neutron beams confirm that cosmic rays are the primary cause of new imager bright points.

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Authors and Affiliations

  1. Image Sensor Solutions, Eastman Kodak Company, 14650, Rochester, NY, USA

    William C. McColgin, Cristian Tivarus & Albert J. Filo

  2. Research Laboratories, Eastman Kodak Company, 14650, Rochester, NY, USA

    Craig C. Swanson

Authors
  1. William C. McColgin
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  2. Cristian Tivarus
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  3. Craig C. Swanson
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  4. Albert J. Filo
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McColgin, W.C., Tivarus, C., Swanson, C.C. et al. Bright-Pixel Defects in Irradiated CCD Image Sensors. MRS Online Proceedings Library 994, 09941206 (2006). https://doi.org/10.1557/PROC-0994-F12-06

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  • DOI: https://doi.org/10.1557/PROC-0994-F12-06

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