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Utilization of Charged Particle Backscattering to Study the Near Surface Region of Glasses. Application to Depth Profiling of Lanthanium, Cerium, Thorium and Uranium Induced by Aqueous Leaching

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References

  1. ENGELMANN, CH., LOEUILLET, M., NENS, B., TROCELLIER, P. Silicates Industriels 2 (1981) 47

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  2. ENGELMANN, CH., NENS, B., TROCELLIER, P. Verres Refract. 35 (1981) 486.

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Authors and Affiliations

  1. Dèpartement de Chimie Appliquèe et d’Etudes Analytiques Service d’Etudes Analytiques - Section d’Etudes et d’Analyse Isotopique et Nuclèaire, CEN Saclay, 91191, Gif-Sur-Yvette Cèdex, France

    Patrick Trocellier, Bernard Nens & Charles Engelmann

Authors
  1. Patrick Trocellier
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  2. Bernard Nens
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  3. Charles Engelmann
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Work performed under contract WAS 268-81-55 F with European Community Commission.

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Trocellier, P., Nens, B. & Engelmann, C. Utilization of Charged Particle Backscattering to Study the Near Surface Region of Glasses. Application to Depth Profiling of Lanthanium, Cerium, Thorium and Uranium Induced by Aqueous Leaching. MRS Online Proceedings Library 11, 193 (1981). https://doi.org/10.1557/PROC-11-193

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  • DOI: https://doi.org/10.1557/PROC-11-193

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