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DX-centers in CdTe and ZnTe Observed by Locally Sensitive Probe Atoms

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Abstract

Heavily In-doped CdTe and ZnTe crystals are investigated using perturbed γγ-angular correlation experiments. By means of characteristic electric field gradients, it is shown that in the Cd (Zn) poor regime, the compensation is governed by A-center formation. After annealing in Cd (Zn) rich atmosphere, the formation of DX-centers is observed and identified as the prevailing compensation mechanism in the Cd (Zn) rich regime.

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Authors and Affiliations

  1. Technische Physik, Universität des Saarlandes, 66041, Saarbrücken, Germany

    S. Lany, H. Wolf & Th. Wichert

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  1. S. Lany
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  2. H. Wolf
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  3. Th. Wichert
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Lany, S., Wolf, H. & Wichert, T. DX-centers in CdTe and ZnTe Observed by Locally Sensitive Probe Atoms. MRS Online Proceedings Library 763, 13 (2002). https://doi.org/10.1557/PROC-763-B1.3

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