Abstract
We present two design methods that produce concurrently testable and cascadable combinational blocks for a given logic function. In the first method, the designed block is strongly fault-secure and code-disjoint. Any unordered coding scheme can be used for the input and output. The second method produces designs that are strongly fault-secure and strongly code-disjoint. Here the encoding requires some simple density properties that are seen to be satisfied by the commonly used coding schemes. This makes the method applicable to a larger class of coding schemes than the existing methods. We also show that our designs have lower hardware overhead.
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Pagey, S., Sherlekar, S.D. & Venkatesh, G. A methodology for the design of SFS/SCD circuits for a class of unordered codes. J Electron Test 2, 261–277 (1991). https://doi.org/10.1007/BF00135442
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DOI: https://doi.org/10.1007/BF00135442