Abstract
Spallation of the protective oxide layer formed during hot gas oxidation is the main reason for the corrosion of high purity powder metallurgically produced chromium[1]. To explain the formation and occasional spallation of the oxide layer a chromium sample subjected to two consecutive oxidation processes in16O and18O atmosphere at high temperature was characterised by 2D and 3D SIMS.
The formation of the protective oxide can be described by the diffusion of chromium from the bulk to the surface and the reaction of the chromium atoms with the oxygen from the gaseous phase. The very low solubility of nitrogen in chromium oxide indicates its inability to diffuse through the growing oxide layer and explains the enrichment of nitrogen (same mechanism applies for chlorine) in the interface metal/oxide. The accumulation of trace elements within the interface during the oxidation process explains the reduced adhesion power of the passivation layer and its spallation.
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H. P. Martinz, W. Köck, T. Sakaki,J. Physique [Suppl. IV(CP)] 1993,III(3), 205.
H. Hutter, Ch. Brunner, P. Wilhartitz, M. Grasserbauer,Mikrochima. Acta 1996,122, 195.
F. G. Rüdenauer, W. Steiger inSecondary Ion Mass Spectrometry SIMS VI (A. Benninghoven, A. M. Huber, H. W. Werner, eds.), Wiley, Chichester, 1988, p. 361.
S. R. Bryan, W. S. Woodward, D. P. Griffis, R. W. Linton,J. Microsc. 1985,138, 15.
F. Michiels, W. Vanhoolst, P. Van Espen, F. Adams,American Society for Mass Spec. 1, 1990, p. 37.
H. Hutter, P. Wilhartitz, M. Grasserbauer,Fresenius. J. Anal. Chem. 1993,346, 66.
H. Hutter, M. Grasserbauer,SIMS VIII-Proceedings of the Amsterdam Conference, Wiley, 1992, p. 533.
H. Hutter, M. Grasserbauer,Mikrochim. Acta 1992,107, 37.
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Dedicated to Professor Dr. rer. nat. Dr. h.c. Hubertus Nickel on the occasion of his 65th birthday
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Brunner, C., Hutter, H., Wilhartitz, P. et al. Investigation of the formation and properties of protective oxide layers on high purity chromium with SIMS imaging techniques. Mikrochim Acta 125, 69–72 (1997). https://doi.org/10.1007/BF01246164
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DOI: https://doi.org/10.1007/BF01246164