Abstract
Different strains of baker’s yeast(Saccharomyces cerevisiae) were imaged with an atomic force microscope (AFM). The images of uncoated and nonfixed samples were reproducible with high-constrast and nanometer-resolution. Molecules from the polysaccharide surface of the cell wall were pictured and the distance of atoms was measured. The preparation of samples was easy, suggesting that AFM is a useful tool in this type of analyses.
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Pereira, R.d.S., Parizotto, N.A. & Baranauskas, V. Observation of baker’s yeast strains used in biotransformation by atomic force microscopy. Appl Biochem Biotechnol 59, 135–143 (1996). https://doi.org/10.1007/BF02787815
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DOI: https://doi.org/10.1007/BF02787815