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Optical properties of epitaxial BiFeO3 thin films

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Abstract

Optical properties of epitaxial BiFeO3 thin films grown via pulsed-laser deposition on (110) DyScO3 substrates have been investigated. Their near-normal spectroscopic reflectivity was measured in the spectral range 2 to 14 eV at room temperature, while spectroscopic ellipsometry in the spectral range 1–6 eV was measured in the temperature range from 300 to 775 K. The optical response functions have been calculated and a direct optical gap was determined varying from 2.75 to 2.70 eV in this temperature range.

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Authors and Affiliations

  1. Institute of Physics, ASCR, Na Slovance 2, 182 21, Praha 8, Czech Republic

    V. Železný, D. Chvostová & L. Pajasová

  2. Max Planck Institute of Microstructure Physics, Weinberg 2, 06120, Halle, Germany

    I. Vrejoiu & M. Alexe

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  1. V. Železný
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  2. D. Chvostová
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  3. L. Pajasová
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  4. I. Vrejoiu
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  5. M. Alexe
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Correspondence to V. Železný.

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Železný, V., Chvostová, D., Pajasová, L. et al. Optical properties of epitaxial BiFeO3 thin films. Appl. Phys. A 100, 1217–1220 (2010). https://doi.org/10.1007/s00339-010-5881-z

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  • DOI: https://doi.org/10.1007/s00339-010-5881-z

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