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Received: 25 July 1997/Accepted: 1 October 1997
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Siebel, E., Memmert, U., Vogel, R. et al. A scanning force microscope for in situ observation of electrochemical processes . Appl Phys A 66 (Suppl 1), S83–S86 (1998). https://doi.org/10.1007/s003390051105
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DOI: https://doi.org/10.1007/s003390051105