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Effect of sintering process on electrical properties and ageing behavior of ZnO–V2O5–MnO2–Nb2O5 varistor ceramics

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Abstract

The effect of sintering process on microstructure, electrical properties, and ageing behavior of ZnO–V2O5–MnO2–Nb2O5 (ZVMN) varistor ceramics was investigated at 875–950 °C. The sintered density decreased from 5.52 to 5.44 g/cm3 and the average grain size increased from 4.4 to 9.6 μm with the increase of sintering temperature. The breakdown field (E1 mA) decreased from 6991 to 943 V/cm with the increase of sintering temperature. The ZVMN varistor ceramics sintered at 900 °C led to surprisingly high nonlinear coefficient (α = 50). The donor concentration (Nd) increased from 3.33 × 1017 cm−3 to 7.64 × 1017 cm−3 with the increase of sintering temperature and the barrier height (Φb) exhibited the maximum value (1.07 eV) at 900 °C. Concerning stability, the varistors sintered at 925 °C exhibited the most stable accelerated ageing characteristics, with %ΔE1 mA = 1.5% and %Δα = 13.3% for DC accelerated ageing stress of 0.85 E1 mA/85 °C/24 h.

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References

  1. C.W. Nahm, Solid. State. Commun. 149, 795 (2009)

    Article  CAS  Google Scholar 

  2. L.M. Levinson, H.R. Philipp, Am. Ceram. Soc. Bull. 65, 639 (1986)

    CAS  Google Scholar 

  3. T.K. Gupta, J. Am. Ceram. Soc. 73, 1817 (1990)

    Article  CAS  Google Scholar 

  4. J.-K. Tsai, T.-B. Wu, J. Appl. Phys. 76, 4817 (1994)

    Article  CAS  Google Scholar 

  5. J.-K. Tsai, T.-B. Wu, Mater. Lett. 26, 199 (1996)

    Article  CAS  Google Scholar 

  6. C.T. Kuo, C.S. Chen, I.-N. Lin, J. Am. Ceram. Soc. 81, 2942 (1998)

    Article  CAS  Google Scholar 

  7. H.-H. Hng, K.M. Knowles, J. Am. Ceram. Soc. 83, 2455 (2000)

    Article  CAS  Google Scholar 

  8. H.-H. Hng, P.L. Chan, Mater. Chem. Phys. 75, 61 (2002)

    Article  CAS  Google Scholar 

  9. H.-H. Hng, L. Halim, Mater. Lett. 57, 1411 (2003)

    Article  CAS  Google Scholar 

  10. C.-W. Nahm, J. Mater. Sci. 42, 8370 (2007)

    Article  CAS  Google Scholar 

  11. C.-W. Nahm, Ceram. Int. 35, 3435 (2010)

    Article  Google Scholar 

  12. C.-W. Nahm, J. Alloy. Compd. 490, L52 (2010)

    Article  CAS  Google Scholar 

  13. C.-W. Nahm, Ceram. Int. 36, 1109 (2010)

    Article  CAS  Google Scholar 

  14. C.-W. Nahm, Mater. Lett. 64, 830 (2010)

    Article  CAS  Google Scholar 

  15. C.-W. Nahm, J. Mater. Sci. Mater. Electron. 21, 540 (2010)

    Article  CAS  Google Scholar 

  16. C.-W. Nahm, J. Mater. Sci. Mater. Electron. 22, 444 (2011)

    Article  CAS  Google Scholar 

  17. J.C. Wurst, J.A. Nelson, J. Am. Ceram. Soc. 55, 109 (1972)

    Article  CAS  Google Scholar 

  18. M. Mukae, K. Tsuda, I. Nagasawa, J. Appl. Phys. 50, 4475 (1979)

    Article  CAS  Google Scholar 

  19. J. Fan, R. Freer, J. Am. Ceram. Soc. 77, 2663 (1994)

    Article  CAS  Google Scholar 

  20. M. F. Yan, A. H. Heuer, Additives and interfaces in electronic ceramics. Am. Ceram. Soc. Columbus OH 80, (1983)

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  1. Semiconductor Ceramics Laboratory, Department of Electrical Engineering, Dongeui University, Busan, 614-714, Korea

    Choon-W. Nahm

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  1. Choon-W. Nahm
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Nahm, CW. Effect of sintering process on electrical properties and ageing behavior of ZnO–V2O5–MnO2–Nb2O5 varistor ceramics. J Mater Sci: Mater Electron 23, 457–463 (2012). https://doi.org/10.1007/s10854-011-0512-9

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  • DOI: https://doi.org/10.1007/s10854-011-0512-9

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