Abstract
The oxidation of chromium at 300 °C was investigated in situ by ToF-SIMS for three different oxygen pressures (\(P_{{{\text{O}}_{2} }} = 2.0 \times 10^{ - 7}\), 6.0 × 10−7 and 2.0 × 10−6 mbar). Sequential exposure to the 18O isotopic tracer was performed to reveal the governing transport mechanism in the oxide film. The evolution of the oxide thickness was monitored. Volatilization of Cr2O3 was evidenced. A model was used to describe the kinetics resulting from the measurements. Both the parabolic and volatilization constants showed a dependence on oxygen partial pressure like \(P_{{{\text{O}}_{2} }}^{ - 1/n}\), with n = 1.9 ± 0.1, indicating a defect structure mainly consisting of oxygen vacancies. The re-oxidation in 18O2 shows a growth of the oxide layer at the metal/oxide interface, demonstrating an oxidation process governed by anionic transport via oxygen vacancies. The diffusion coefficient of oxygen in the oxide was determined by fitting the ToF-SIMS depth profiles. It is 2.0 × 10−18 cm2 s−1.
Similar content being viewed by others
References
R. Sachitanand, M. Sattari, J. E. Svensson and J. Froitzheim, International Journal of Hydrogen Energy 38, 15328 (2013).
S. P. Jiang and Y. Zhen, Solid State Ionics 179, 1459 (2008).
V. A. C. Haanappel, T. Fransen and P. J. Gellings, High Temperature Materials and Processes 10, 91 (1992).
E. J. Opila, Journal of the American Ceramic Society 86, 1238 (2003).
Y. Chen, T. Tan and H. Chen, Journal of Nuclear Science and Technology 45, 662 (2008).
D. J. Young and B. A. Pint, Oxidation of Metals 66, 137 (2006).
R. O. Adams, Journal of Vacuum Science and Technology A 1, 12 (1983).
J. R. Lince, S. V. Didziulis, D. K. Shuh, T. D. Durbin and J. A. Yarmo, Surface Science 277, 43 (1992).
A. P. Gree, C. W. Louw and H. C. Swart, Corrosion Science 42, 1725 (2000).
W. T. Geng, Physical Review B 68, 233402 (2003).
L. Pramatarova, E. Pecheva, V. Krastev and F. Riesz, Journal of Materials Science: Materials in Medicine 18, 435 (2007).
P. Jussila, K. Lahtonen, M. Lampimäki, M. Hirsimäki and M. Valden, Surface and Interface Analysis 40, 1149 (2008).
P. Jussila, H. Ali-Löytty, K. Lahtonen, M. Hirsimäki and M. Valden, Surface Science 603, 3005 (2009).
A. C. S. Sabioni, A. M. Huntz, J. Philibert, B. Lesage and C. Monty, Journal of Materials Science 27, 4782 (1992).
K. P. Lillerud and P. Kofstad, Journal of the Electrochemical Society 127, 2397 (1980).
K. P. Lillerud and P. Kofstad, Oxidation of Metals 17, 127 (1982).
M.Y. Su, and G. Simkovitch, Technical report of the Applied Research Laboratory of the Pennsylvania State University (1987).
C. Wagner, Journal of the Electrochemical Society 99, 369 (1952).
N. Cabrera and N. F. Mott, Reports on Progress in Physics 12, 163 (1949).
D. D. Eley and P. R. Wilkinson, Proceedings of the Royal Society of London A 254, 327 (1960).
F. P. Fehlner and N. F. Mott, Oxidation of Metals 2, 59 (1970).
C. S. Tedmon, Journal of the Electrochemical Society 113, 766 (1966).
A. Mazenc, A. Galtayries, A. Seyeux, P. Marcus and S. Leclercq, Surface and Interface Analysis 45, 583 (2013).
A. Mazenc. Ph.D. thesis, Université Pierre et Marie Curie (2013).
P. Kofstad, Oxidation of Metals 44, 3 (1995).
J. H. Park, W. E. King and S. J. Rothman, Journal of the American Ceramic Society 70, 880 (1987).
A. C. S. Sabioni, E. A. Malheiros, V. Ji, F. Jomard, W. A. de Almeida Macedo and P. Gastelois, Oxidation of Metals 81, 407 (2014).
S. C. York, M. W. Abee and D. F. Cox, Surface Science 437, 386 (1999).
C. Pereira-Nabais, J. Swiatowska, M. Rosso, F. Ozanam, A. Seyeux, A. Gohier, P. Tran-Van, M. Cassir and P. Marcus, ACS Applied Materials and Interfaces 6, 13023 (2014).
P. Lu and S. J. Harris, Electrochemistry Communications 13, 1035 (2011).
S. Shi, P. Lu, Z. Liu, Y. Qi, L. G. Hector, H. Li and S. J. Harris, Journal of the American Chemical Society 134, 15476 (2012).
G. K. Boreskov, Advances in Catalysis 15, 285 (1965).
W. C. Hagel, Journal of the American Ceramic Society 48, 70 (1965).
Acknowledgements
Financial supports by EDF R&D and by Région Ile-de-France are acknowledged.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Poulain, C., Seyeux, A., Voyshnis, S. et al. Volatilization and Transport Mechanisms During Cr Oxidation at 300 °C Studied In Situ by ToF-SIMS. Oxid Met 88, 423–433 (2017). https://doi.org/10.1007/s11085-017-9756-y
Received:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s11085-017-9756-y