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A Low-Loss Built-In Current Sensor

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Abstract

This paper presents a novel built-in current sensor that uses two additional power supply voltages besides the system power supply voltage, and that is constructed by using a current mirror circuit to pick up an abnormal IDDQ. It is activated only by an abnormal quiescent power supply current and minimizes the voltage drop at the terminal of the circuit under test. Simulation results showed that it could detect 16-μA IDDQ against 0.03-V voltage drop at 3.3-V VDD and that it reduced performance degradation in the circuit under test. It is therefore suitable for testing low-voltage integrated circuits. Moreover, we verified the behavior of the sensor circuit implemented on the board by using discrete devices. Experimental results showed that the real circuit of the sensor functioned properly.

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Authors and Affiliations

  1. Graduate School of Engineering, Tokyo Metropolitan University, 1-1 Minami-Osawa, Hachioji, Tokyo, 192-0397, Japan

    Yukiya Miura & Hiroshi Yamazaki

Authors
  1. Yukiya Miura
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  2. Hiroshi Yamazaki
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Miura, Y., Yamazaki, H. A Low-Loss Built-In Current Sensor. Journal of Electronic Testing 14, 39–48 (1999). https://doi.org/10.1023/A:1008393104650

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  • DOI: https://doi.org/10.1023/A:1008393104650

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