Skip to main content
SpringerLink
Log in

Refined Structure of Langmuir Lysozyme Films on Single-Crystal Silicon Wafers According to X-Ray Reflectivity Data

  • DIFFRACTION AND SCATTERING OF IONIZING RADIATIONS
  • Published:
Crystallography Reports Aims and scope Submit manuscript

Abstract

Thin lysozyme films on single-crystal silicon wafers have been studied by X-ray reflectivity. The films have been formed using the modified Langmuir–Schaefer method with potassium chloride as a precipitant. A layered model of the structure of the investigated films based on the calculated electron density distribution in a lysozyme molecule is proposed. It is shown that the model obtained in this way allows one to refine the structure of investigated films when processing reflectivity data.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Fig. 1.
Fig. 2.
Fig. 3.
Fig. 4.

Similar content being viewed by others

REFERENCES

  1. J. Fraden, Handbook of Modern Sensors (Springer, Cham, 2016).

    Google Scholar 

  2. I. Langmuir and V. J. Schaefer, J. Am. Chem. Soc. 60 (6), 1351 (1938). https://doi.org/10.1021/ja01273a023

    Article  Google Scholar 

  3. M. V. Kovalchuk, A. S. Boikova, Yu. A. D’yakova, et al., Crystallogr. Rep. 62 (4), 632 (2017). https://doi.org/10.7868/S0023476117040129

    Article  ADS  Google Scholar 

  4. A. S. Boikova, Yu. A. D’yakova, K. B. Il’ina, et al., Crystallogr. Rep. 63 (5), 719 (2018). https://doi.org/10.1134/S1063774518050061

    Article  ADS  Google Scholar 

  5. A. Ducruix, J. P. Guilloteau, M. Ries-Kautt, et al., J. Cryst. Growth 168, 28 (1996). https://doi.org/10.1016/0022-0248(96)00359-4

    Article  ADS  Google Scholar 

  6. A. S. Boikova, Y. A. Dyakova, K. B. Ilina, et al., Acta Crystallogr. D 73 (7), 591 (2017). https://doi.org/10.1107/S2059798317007422

    Article  Google Scholar 

  7. Yu. V. Kordonskaya, V. I. Timofeev, Yu. A. D’yakova, et al., Crystallogr. Rep. 63 (6), 947 (2018). https://doi.org/10.1134/S1063774518060196

    Article  ADS  Google Scholar 

  8. M. V. Kovalchuk, A. S. Boikova, Y. A. Dyakova, et al., Thin Solid Films 677, 13 (2019). https://doi.org/10.1016/j.tsf.2019.02.051

    Article  ADS  Google Scholar 

  9. M. V. Kovalchuk and V. G. Kon, Usp. Fiz. Nauk 149 (1), 69 (1986). https://doi.org/10.3367/UFNr.0149.198605c.0069

    Article  Google Scholar 

  10. M. V. Kovalchuk, P. A. Prosekov, M. A. Marchenkova, et al., Crystallogr. Rep. 59 (5), 679 (2014). https://doi.org/10.1134/S1063774514050095

    Article  ADS  Google Scholar 

  11. L. G. Parratt, Phys. Rev. 95 (2), 359 (1954). https://doi.org/10.1103/PhysRev.95.359

    Article  ADS  Google Scholar 

  12. D. W. Marquardt, J. Soc. Ind. Appl. Math. 11 (2), 431 (1963). https://doi.org/10.1137/0111030

    Article  Google Scholar 

  13. W. Press, S. Teukolsky, W. Vatterling, et al., Numerical Recipes, the Art of Scientific Computing (Cambridge Univ. Press, Cambridge, 2007).

    MATH  Google Scholar 

  14. Yu. A. Dyakova, K. B. Il’ina, P. V. Konarev, et al., Crystallogr. Rep. 62 (3), 364 (2017). https://doi.org/10.1134/S1063774517030051

    Article  ADS  Google Scholar 

Download references

ACKNOWLEDGMENTS

This study was carried out using the equipment of the Center for Collective Use of the Federal Research Center “Crystallography and Photonics” of the Russian Academy of Sciences, project no. RFMEFI62119X0035.

Funding

This study was supported by the Ministry of Science and Higher Education of the Russian Federation within the State assignment to the Federal Research Center “Crystallography and Photonics” of the Russian Academy of Sciences.

Author information

Authors and Affiliations

  1. Shubnikov Institute of Crystallography, Federal Research Center “Crystallography and Photonics,” Russian Academy of Sciences, 119333, Moscow, Russia

    M. S. Folomeshkin, A. S. Boikova, Yu. A. Volkovsky, M. A. Marchenkova, P. A. Prosekov & A. Yu. Seregin

  2. National Research Center “Kurchatov Institute”, 123182, Moscow, Russia

    M. S. Folomeshkin, A. S. Boikova, Yu. A. Volkovsky, M. A. Marchenkova, P. A. Prosekov & A. Yu. Seregin

Authors
  1. M. S. Folomeshkin
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. A. S. Boikova
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. Yu. A. Volkovsky
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. M. A. Marchenkova
    View author publications

    You can also search for this author in PubMed Google Scholar

  5. P. A. Prosekov
    View author publications

    You can also search for this author in PubMed Google Scholar

  6. A. Yu. Seregin
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to M. S. Folomeshkin.

Additional information

Translated by E. Bondareva

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Folomeshkin, M.S., Boikova, A.S., Volkovsky, Y.A. et al. Refined Structure of Langmuir Lysozyme Films on Single-Crystal Silicon Wafers According to X-Ray Reflectivity Data. Crystallogr. Rep. 65, 827–831 (2020). https://doi.org/10.1134/S1063774520060152

Download citation

  • Received:

  • Revised:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1134/S1063774520060152

Search

Navigation