Abstract
To acquire a rational minimum cut-off time and the precision of lifetime prediction with respect to cut-off time for the accelerated aging test of LED lamps, fifth-order moving average error estimation is adopted in this paper. Eighteen LED lamps from the same batch are selected for two accelerated aging tests, with 10 samples at 80 °C and eight samples at 85 °C. First, the accelerated lifetime of each lamp is acquired by exponential fitting of the lumen maintenances of the lamp for a certain cut-off time. With the acquired lifetimes of all lamps, the two-parameter Weibull distribution of the failure probability is obtained, and the medium lifetime is calculated. Then, the precision of the medium lifetime prediction for different cut-off times is obtained by moving average error estimation. It is shown that there exists a minimum cut-off time for the accelerated aging test, which can be determined by the variation of the moving average error versus the cut-off time. When the cut-off time is less than this value, the lifetime estimation is irrational. For a given cut-off time, the precision of lifetime prediction can be computed by average error evaluation, and the error of lifetime estimation decreases gradually as the cut-off time increases. The minimum cut-off time and medium lifetime of LED lamps are both sensitive to thermal stress. The minimum cut-off time is 1104 h with the lifetime estimation error of 1.15% for the test at 80 °C, and 936 h with the lifetime estimation error of 1.24% for the test at 85 °C. With the lifetime estimation error of about 0.46%, the median lifetimes are 7310 h and 4598 h for the tests at 80 °C and 85°C, respectively.
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15 December 2017
In the original version of this article, the second affiliation should be removed, and the correct affiliations are as given above.
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Project supported by the National High-Tech R&D Program (863) of China (Nos. 2015AA03A101 and 2013AA03A116) and the Cui Can Project of Chinese Academy of Sciences (No. KZCC-EW-102)
An erratum to this article is available at https://doi.org/10.1631/FITEE.15e0483.
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Hao, J., Jing, L., Ke, Hl. et al. Determination of cut-off time of accelerated aging test under temperature stress for LED lamps. Frontiers Inf Technol Electronic Eng 18, 1197–1204 (2017). https://doi.org/10.1631/FITEE.1500483
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DOI: https://doi.org/10.1631/FITEE.1500483