Overview
- Features comprehensive discussion on the dielectric function of nanoscale materials
- Covers novel 2D materials such as graphene, Transition Metal Dichalcogenides, and nanoscale films and wires made from semiconductors
- Relates the fundamental physics of nanoscale materials in an easily understood manner and provides examples of their application
- Describes the fundamental physics necessary to understand the interaction of light with nanoscale materials
Part of the book series: Springer Series in Materials Science (SSMATERIALS, volume 318)
Access this book
Tax calculation will be finalised at checkout
Other ways to access
Table of contents (9 chapters)
-
Front Matter
-
Back Matter
Keywords
About this book
2D materials, such as graphene and transition metal dichalcogenides, are host to unique electrical properties resulting from the electronic band structure. This book devotes significant attention to the optical and electrical properties of 2D and topological materials with an emphasis on optical measurements, electrical characterization of carrier transport, and a discussion of the electronic band structures using a tight binding approach. This book succinctly compiles useful fundamental and practical information from one of the fastest growing research topics in materials science and is thus an essential compendium for both students and researchers in this rapidly moving field.
Authors and Affiliations
About the authors
Alain Diebold is Professor Emeritus and an Empire Innovation Professor of Nanoscale Science in the College of Nanoscale Science and Engineering at the State University of New York’s Polytechnic Institute. His primary research areas include nanoscale characterization and metrology as well as materials science at the nanoscale using optical and X-Ray measurements, electron microscopy, and semiconductor metrology. One part of this research involves extending these concepts to new materials and structures.
Dr. Diebold earned his BS in Chemistry from Indiana University-Purdue University, and holds a PhD in Chemistry from Purdue University where his thesis topic was Statistical Mechanics of Gas-Solid Surface Scattering. He is Associate Editor of the IEEE Transactions on Semiconductor Manufacturing. A frequent presenter at international conferences, Dr. Diebold has been named a Fellow of both the International Society for Optics and Photonics (SPIE) and the American Vacuum Society (AVS).
Tino Hofmann is an assistant professor at the University of North Carolina at Charlotte. His expertise is in the area of complex materials’ characterization. His research work covers a broad range of experimental condensed matter physics and photonics with a strong emphasis on characterizing the anisotropic optical response of spatially-coherent nanostructured materials in the visible and THz spectral range. A part of his research involves the design and construction of optical instruments for the characterization of metamaterials and metasurfaces.Dr. Hofmann received both his Dr. rer. nat. in Physics and his Diploma in Physics, from the University Leipzig, Germany. Dr. Hofmann is the recipient of a 2014 EU Marie Curie Fellowship and A VINNMER Fellow (Fellowship of the Swedish innovation agency VINNOVA).
Bibliographic Information
Book Title: Optical and Electrical Properties of Nanoscale Materials
Authors: Alain Diebold, Tino Hofmann
Series Title: Springer Series in Materials Science
DOI: https://doi.org/10.1007/978-3-030-80323-0
Publisher: Springer Cham
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer Nature Switzerland AG 2021
Hardcover ISBN: 978-3-030-80322-3Published: 11 January 2022
Softcover ISBN: 978-3-030-80325-4Published: 12 January 2023
eBook ISBN: 978-3-030-80323-0Published: 10 January 2022
Series ISSN: 0933-033X
Series E-ISSN: 2196-2812
Edition Number: 1
Number of Pages: XIX, 484
Number of Illustrations: 228 b/w illustrations, 4 illustrations in colour
Topics: Optical and Electronic Materials, Nanoscale Science and Technology, Characterization and Evaluation of Materials, Spectroscopy and Microscopy, Semiconductors