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EMC 2008

Vol 1: Instrumentation and Methods

  • Conference proceedings
  • © 2008

Overview

Editors:
  1. Martina Luysberg

    1. Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons Institute of Solid State Research, Research Centre Jülich, Jülich, Germany

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  2. Karsten Tillmann

    1. Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons Institute of Solid State Research, Research Centre Jülich, Jülich, Germany

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  3. Thomas Weirich

    1. Central Facility for Electron Microscopy, RWTH Aachen, Aachen, Germany

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Table of contents (417 papers)

  1. Front Matter

    Pages I-XXXVIII
    Download chapter PDF

  2. Instrumentation and Methods

    1. Aberration corrected STEM and EELS: Atomic scale chemical mapping

      • A. L. Bleloch, M. Gass, L. Jiang, B. Mendis, K. Sader, P. Wang
      Pages 1-2

    2. An update on the TEAM project — first results from the TEAM 0.5 microscope, and its future development

      • U. Dahmen, R. Erni, C. Kisielowki, V. Radmilovic, Q. Ramasse, A. Schmid et al.
      Pages 3-4

    3. Synchrotron based X-ray Microscopy: state of the art and applications

      • J. Susini
      Pages 5-6

    4. High-resolution spectro-microscopy with low-voltage electrons and double aberration correction

      • Thomas Schmidt, Helder Marchetto, Rainer Fink, Eberhard Umbach, the SMART collaboration
      Pages 7-8

  3. TEM and STEM instrumentation and Electron Optics

    1. Aberration Correctors

      1. Developments of aberration correction systems for current and future requirements
        • M. Haider, H. Müller, S. Uhlemann, P. Hartel, J. Zach
        Pages 9-10
      2. STEM Aberration Correction: an Integrated Approach
        • Ondrej Krivanek, Niklas Dellby, Matt Murfitt, Christopher Own, Zoltan Szilagyi
        Pages 11-12
      3. Applications of aberration-corrected TEM-STEM and high-resolution EELS for the study of functional materials
        • G. A. Botton, C. Maunders, L. Gunawan, K. Cui, L. Y. Chang, S. Lazar
        Pages 13-14
      4. Aberration corrected TEM and STEM for dynamic <i>in situ</i> experiments
        • Pratibha L. Gai, Edward D. Boyes
        Pages 15-16
      5. HREM study of the SrTiO3 Σ3 (112) grain boundary
        • K. J. Dudeck, N. Benedek, D. J. H. Cockayne
        Pages 17-18
      6. A Method to Measure Source Size in Aberration Corrected Electron Microscopes
        • C. Dwyer, J. Etheridge, R. Erni
        Pages 19-20
      7. Determining resolution in the transmission electron microscope: object-defined resolution below 0.5Å
        • B. Freitag, C. Kisielowski
        Pages 21-22
      8. Direct measurement of aberrations by convergent-beam electron holography (CHEF)
        • C. Gatel, F. Houdellier, M. J. Hÿtch
        Pages 23-24
      9. Atomic Structure of BiFeO3-BiCrO3 film on (111) SrTiO3 Grown by Dual Cross Beam Pulsed Laser Deposition
        • L. Gunawan, R. Nechache, C. Harnagea, A. Pignolet, G. A. Botton
        Pages 25-26
      10. Demonstration of CC/CS-correction in HRTEM
        • P. Hartel, H. Müller, S. Uhlemann, J. Zach, U. Löbau, R. Höschen et al.
        Pages 27-28
      11. New electron diffraction technique using Cs-corrected annular LACDIF: comparison with electron precession
        • Florent Houdellier, Sara Bals
        Pages 29-30
      12. The newly installed aberration corrected dedicated STEM (Hitachi HD2700C) at Brookhaven National Laboratory
        • H. Inada, Y. Zhu, J. Wall, V. Volkov, K. Nakamura, M. Konno et al.
        Pages 31-32
      13. Uranium single atom imaging and EELS mapping using aberration corrected STEM and LN2 cold stage
        • H. Inada, J. Wall, Y. Zhu, V. Volkov, K. Nakamura, M. Konno et al.
        Pages 33-34
      14. Sub-Ångstrøm Low-Voltage Electron Microscopy — future reality for deciphering the structure of beam-sensitive nanoobjects?
        • U. Kaiser, A. Chuvilin, R. R. Schröder, M. Haider, H. Rose
        Pages 35-36
      15. Detecting and resolving individual adatoms, vacancies, and their dynamics on graphene membranes
        • J. C. Meyer, C. Kisielowski, R. Erni, A. Zettl
        Pages 37-38
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Keywords

About this book

Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008. Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world. The scientific programme covers all recent developments in the three major areas of instrumentation and methods, materials science and life science.

Editors and Affiliations

  • Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons Institute of Solid State Research, Research Centre Jülich, Jülich, Germany

    Martina Luysberg, Karsten Tillmann

  • Central Facility for Electron Microscopy, RWTH Aachen, Aachen, Germany

    Thomas Weirich

Bibliographic Information

  • Book Title: EMC 2008

  • Book Subtitle: Vol 1: Instrumentation and Methods

  • Editors: Martina Luysberg, Karsten Tillmann, Thomas Weirich

  • DOI: https://doi.org/10.1007/978-3-540-85156-1

  • Publisher: Springer Berlin, Heidelberg

  • eBook Packages: Physics and Astronomy, Physics and Astronomy (R0)

  • Copyright Information: Springer-Verlag Berlin Heidelberg 2008

  • Hardcover ISBN: 978-3-540-85154-7Published: 26 August 2008

  • Softcover ISBN: 978-3-662-50225-9Published: 23 August 2016

  • eBook ISBN: 978-3-540-85156-1Published: 29 August 2008

  • Edition Number: 1

  • Number of Pages: XXXVIII, 862

  • Topics: Physics, general

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