Abstract
The measurement of surface profile by projecting phase-stepped fringe patterns at an angle to the observation direction is well known. Ambiguous range data results, however, when the object has discontinuities in its profile. The ambiguities can be prevented by projecting fringes of varying spatial frequency. In this paper we describe an approach which combines high accuracy and reliability. The spatial frequency is reduced exponentially from the maximum value. The sequence of phase values at a given pixel is then unwrapped independently of the other image pixels, and all the intermediate phase values contribute in a least squares sense to the final range estimate for the pixel. The algorithm has been implemented on a pipeline image processing system. The fringe patterns are projected at 30 frames s−1 using a high resolution data projector. Images are acquired and analysed in real time, at the same framing rate. A total acquisition and processing time of 0.75 s has been achieved for a maximum spatial frequency of 16 fringes across the field of view.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Brooks R E and Heflinger L O Appl. Opt. 8 (1969) 935–939.
Indebetouw G Appl. Opt. 17 (1978) 2930–2933.
Srinivasan V, Liu H C and Halioua M Appl. Opt. 23 (1984) 3105–3108.
Zhao H, Chen W and Tan Y Appl. Opt. 33 (1994) 4497–4500.
Saldner H O and Huntley J M Appl. Opt. 36 (1997) 2770–2775.
Saldner H O and Huntley J M Opt. Eng. 36 (1997) 610–615.
Nadebom W, Andrä P and Osten W Opt. Lasers Eng. 24 (1996) 245–260.
Xie X, Atkinson J T, Lalor M J and Burton D Opt. Lasers Eng. 27 (1997) 247–257.
Huntley J M and Saldner H O J. Opt. Soc. Am. A 14 (1997) 3188–3196.
Huntley J M and Saldner H O Proc. SPIE 3100 (1997) 185–192.
Huntley J M and Saldner H O Appl. Opt. 32 (1993) 3047–3052.
Creath K in Interferogram Analysis D. W. Robinson and G. T. Reid, eds. (Bristol: Institute of Physics) 1993.
Huntley J M and Saldner H O Meas. Sci. Technol. 8 (1997) 986–992.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2000 Kluwer Academic Publishers
About this paper
Cite this paper
Huntley, J.M., Coggrave, C.R. (2000). High Speed Measurement of Discontinuous Surface Profiles. In: Lagarde, A. (eds) IUTAM Symposium on Advanced Optical Methods and Applications in Solid Mechanics. Solid Mechanics and its Applications, vol 82. Springer, Dordrecht. https://doi.org/10.1007/0-306-46948-0_18
Download citation
DOI: https://doi.org/10.1007/0-306-46948-0_18
Publisher Name: Springer, Dordrecht
Print ISBN: 978-0-7923-6604-1
Online ISBN: 978-0-306-46948-0
eBook Packages: Springer Book Archive