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Principles of Basic and Advanced Scanning Probe Microscopy

  • Conference paper
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials

Part of the book series: NATO Science Series II: Mathematics, Physics and Chemistry ((NAII,volume 186))

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Abstract

Understanding the behavior of complex materials such as organic self-assembled monolayers, molecular and nano wires, transition metal oxide thin films, is facilitated by probes of local properties. Recent extensions of scanning probe microscopy that extract electrical potential, capacitance, dielectric constant, electromechanical coupling coefficients and impedance, are described. In most cases, these complex properties are accessed by stimulations and/or response function detection with multiple frequency modulations. Several illustrative example include determination of the electronic structure of individual defects in a carbon nanotube, ferroelectric domain interactions in oxide thin films, and electric potential of an alkanethiol on metal.

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  1. Department of Materials Science and Engineering, University of Pennsylvania, 3231 Walnut ST, Philadelphia, PA, 19104, USA

    D.A. Bonnell & R. Shao

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  1. University of Aveiro, Portugal

    Paula Maria Vilarinho

  2. Tel Aviv University, Ramat - Aviv, Israel

    Yossi Rosenwaks

  3. NCSU, Raleigh, NC, USA

    Angus Kingon

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Bonnell, D., Shao, R. (2005). Principles of Basic and Advanced Scanning Probe Microscopy. In: Vilarinho, P.M., Rosenwaks, Y., Kingon, A. (eds) Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials. NATO Science Series II: Mathematics, Physics and Chemistry, vol 186. Springer, Dordrecht. https://doi.org/10.1007/1-4020-3019-3_4

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