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Study of Ferromagnet-Antiferromagnet Interfaces Using X-Ray PEEM

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Magnetic Microscopy of Nanostructures

Part of the book series: NanoScience and Technology ((NANO))

Abstract

This chapter discusses polarization dependent X-ray photoemission electron microscopy (X-PEEM) and its application to coupled magnetic layers, in particular ferromagnet-antiferromagnet structures.

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Authors
  1. A. Scholl
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  2. H. Ohldag
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  3. F. Nolting
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  4. S. Anders
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  5. J. Stöhr
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Editor information

Editors and Affiliations

  1. Department of Physics and Astronomy, University of California, Irvine, CA, 92697, USA

    Herbert Hopster

  2. Institut für Angewandte Physik und Zentrum für Mikrostrukturforschung, Universität Hamburg, Jungiusstr. 11, 20355, Hamburg, Germany

    Hans Peter Oepen

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Scholl, A., Ohldag, H., Nolting, F., Anders, S., Stöhr, J. (2005). Study of Ferromagnet-Antiferromagnet Interfaces Using X-Ray PEEM. In: Hopster, H., Oepen, H.P. (eds) Magnetic Microscopy of Nanostructures. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-26641-0_2

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