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Single-View Metrology: Algorithms and Applications (Invited Paper)

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Pattern Recognition (DAGM 2002)

Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 2449))

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Abstract

This paper addresses the problem of extracting three-dimensional geometric information from a single, uncalibrated image of a scene.

This work, building upon [7], is divided into two parts. The first part describes, in simple steps, the basic algorithms to obtain partial or complete geometric reconstruction from single perspective images of a scene. The second part presents a panorama of applications of single-view metrology and discusses its relationship with different disciplines such as architecture, history of art and forensic science. Furthermore, techniques for increasing the level of automation of the reconstruction process are herein described.

Several examples on photographs and historical paintings demonstrate the power and flexibility of the proposed techniques.

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Author information

Authors and Affiliations

  1. Microsoft Research, One Microsoft Way, Redmond, WA

    Antonio Criminisi

Authors
  1. Antonio Criminisi
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Editor information

Editors and Affiliations

  1. Computer Vision Laboratory, ETH Zürich, Gloriastrasse 35, 8092, Zürich, Switzerland

    Luc Van Gool

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© 2002 Springer-Verlag Berlin Heidelberg

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Criminisi, A. (2002). Single-View Metrology: Algorithms and Applications (Invited Paper). In: Van Gool, L. (eds) Pattern Recognition. DAGM 2002. Lecture Notes in Computer Science, vol 2449. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-45783-6_28

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  • DOI: https://doi.org/10.1007/3-540-45783-6_28

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-44209-7

  • Online ISBN: 978-3-540-45783-1

  • eBook Packages: Springer Book Archive

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