Abstract
Conducting scanning probe microscopy provides a powerful tool for measuring electric transport through small surface features. In this chapter, carbon nanotubes and carbon nanotube networks are analyzed with a scanning probe microscopy method that employs solid metal tips to provide improved electrical contact to the nanotubes. The study reveals paths of electrical transport through carbon nanotubes and provides a means to differentiate between semiconducting and metallic nanotubes. Finally, high-resolution images provide insight into the conductance decay around nanotube junctions.
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References
S. lijima, Nature 354, 56 (1991).
A. Bachtold, M. S. Fuhrer, S. Plyasunov, M. Forero, E. H. Anderson, A. Zettl, and P. L. McEuen, Phys. Rev. Lett. 84, 6082 (2000).
M. Freitag, M. Radosavljević, W. Clauss, and A. T. Johnson, Phys. Rev. B 62, R2307(2000).
P. J. de Pablo, C. Gómez-Navarro, J. Colchero, P. A. Serena, J. Gómez-Herrero, and A. M. Baró, Phys. Rev. Lett. 88, 036804 (2002).
M. Stadermann, S. Papadakis, M. Falvo, J. Novak, E. Snow, Q. Fu, J. Liu, Y. Fridman, J. Boland, R. Superfine, and S. Washburn, Phys. Rev. B 69, 201402(R) (2004).
D. J. Thouless, Phys. Rev. Lett. 39, 1167 (1977).
N. Mott and W. Twose, Adv. Phys. 10, 107 (1961).
A. B. Fowler, A. Hartstein, and R. A. Webb, Phys. Rev. Lett. 48, 196 (1982).
A. Miller and E. Abrahams, Phys. Rev. 120, 745 (1960).
J. Voit, Rept. Prog. Phys. 58, 977 (1996).
A. Yacoby, H. L. Stormer, N. S. Wingreen, L. N. Pfeiffer, K. W. Baldwin, and K. W. West, Phys. Rev. Lett. 77, 4612 (1996).
F. P. Milliken, C. P. Umbach, and R. A. Webb, Solid State Comm. 97, R10653 (1996).
M. Bockrath, D. Cobden, A. Rinzler, R. Smalley, L. Balents, and P. McEuen, Nature 397, 598 (1999).
H.W. C. Postma, M. de Jonge, Z. Yao, and C. Dekker, Phys. Rev. B 62, R10653 (2000).
C. White and T. Todorov, Nature 393, 240 (1998).
P. A. Lee and T. V. Ramakrishnan, Rev. Mod. Phys. 57, 287 (1985).
F. Houzé, R. Meyer, O. Schneegans, and L. Boyer, Appl. Phys. Lett. 69, 1975 (2000).
M. Lantz, S. O’Shea, and M. Welland, Phys. Rev. B 56, 15 345 (1997).
H. Dai, E. Wong, and C. Lieber, Science 272, 523 (1996).
M. Lantz, S. O’Shea, and M. Welland, Rev. Sci. Instr. 69, 1757 (1998).
S. O’Shea, R. Atta, and M. Welland, Rev. Sci. Instr. 66, 2508 (1995).
M. Stadermann, H. Grube, J. Boland, S. Papadakis, M. Falvo, R. Superfine, and S. Washburn, Rev. Sci. Instr. 74, 3653 (2003).
H. Edwards, L. Taylor, W. Duncan, and A. J. Melmed, J. Appl. Phys. 82, 980 (1997).
F. Giessibl, Appl. Phys. Lett. 73, 3956 (1998).
F. Giessibl, Appl. Phys. Lett. 76, 1470 (2000).
J. Liu, A. Rinzler, H. Dai, J. Haffner, R. Bradley, P. Boul, A. Lu, T. Iverson, K. Shelimov, C. Huffman, F. Rodriguez-Macias, Y. Shon, T. Lee, D. Colbert, and R. Smalley, Science 280, 1253 (1998).
Q. Fu, C. Lu, and J. Liu, Nano Letters 2, 329 (2002).
J. Kong, N. Franklin, C. Zhou, M. Chapline, S. Peng, K. Cho, and H. Dai, Science 287, 622 (2000).
P. Qi, O. Vermesh, M. Grecu, A. Javey, Q. Wang, H. Dai, S. Peng, and K. Cho, Nano Letters 3, 347 (2003).
T. Someya, J. Small, P. Kim, C. Nuckolls, and J. Yardley, Nano Letters 3, 877 (2003).
E. Snow, J. Novak, P. Campbell, and D. Park, Appl. Phys. Lett. 82, 2145 (2003).
J. Novak, E. Snow, E. Houser, D. P. and. J.L. Stepnowski, and R. McGill, Appl. Phys. Lett. 83, 4026 (2003).
M. Dresselhaus, G. Dresselhaus, and P. Avouris, Carbon Nanotubes: Synthesis, Structure, Properties, and Applications, Vol. 80 of Springer Topics in Applied Physics (Springer Verlag, Berlin Heidelberg New York, 2001).
M. Fuhrer, J. Nygård, L. Shih, M. Forero, Y. Yoon, M. Mazzoni, H. Choi, J. Ihm, S. Louie, A. Zettl, and P. McEuen, Science 288, 494 (2000).
F. Léonard and J. Tersoff, Phys. Rev. Lett. 84, 4693 (2000).
J. Appenzeller, J. Knoch, V. Derycke, R. Martel, S. Wind, and P. Avouris, Phys. Rev. Lett. 89, 126801 (2002).
P. Collins, M. Arnold, and P. Avouris, Science 292, 706 (2001).
M. Stadermann, S. Papadakis, M. Falvo, Q. Fu, J. Liu, Y. Fridman,.1. Boland, R. Superfine, and S. Washburn, Phys. Rev. B, 72, 245406 (2005).
M. Fuhrer, B. Kim, Dürkop, and T. Brintlinger, Nano Lett. 2, 755 (2002).
M. Radosavljević, M. Freitag, K. Thadani, and A. Johnson, Nano Letters 2, 761 (2002).
J. Cumings and A. Zettl, Phys. Rev. Lett. 93, 086801 (2004).
A. Kuznetsova, D. Mawhinney, V. Naumenko, J. Yates, J. Liu, and R. Smalley, Chem. Phys. Lett. 321, 292 (2000).
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Stadermann, M., Washburn, S. (2007). Conductance AFM Measurements of Transport Through Nanotubes and Nanotube Networks. In: Kalinin, S., Gruverman, A. (eds) Scanning Probe Microscopy. Springer, New York, NY. https://doi.org/10.1007/978-0-387-28668-6_16
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DOI: https://doi.org/10.1007/978-0-387-28668-6_16
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