Abstract
Scanning probes have been used to induce a variety of localized changes in the composition of self-assembled monolayers (SAMs). SAMs are useful in this regard because they offer a means to present various chemical functionalities on a surface in a relatively well organized way. This chapter reviews a diverse set of methodologies. However, they all can be generally characterized as either additive (adding molecules to the surface), subtractive (removing molecules from the surface), or exchange (a replacement of one type of molecule with another on the surface. The efficacy and utility of these processes will be emphasized.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Krämer, S., Fuierer, R. R., and Gorman, C. B., Chem. Rev. 103(11), 4367 (2003).
Soh, H. T., Guarini, K. W., and Quate, C. F., Scanning Probe Lithography (Kluwer Academic Publishers, Boston, 2001).
Ross, C. B., Sun, L., and Crooks, R. M., Langmuir 9(3), 632 (1993).
Schoer, J. K., Ross, C. B., Crooks, R. M. et al., Langmuir 10(3), 615 (1994).
Schoer, J. K., Zamborini, F. P., and Crooks, R. M., J. Phys. Chem. 100(26), 11086 (1996).
Schoer, J. K. and Crooks, R. M., Langmuir 13(8), 2323 (1997).
Lercel, M. J., Redinbo, G. F., Craighead, H. G. Sheen, C. W., and Allara, D. L., Appl. Phys. Lett. 65(8), 974 (1994).
Liu, G. Y. and Salmeron, M. B., Langmuir 10(2), 367 (1994).
Touzov, I. and Gorman, C. B., J. Phys. Chem. B 101, 5263 (1997).
Kelley, S. O., Barton, J. K., Jackson, N. M., McPherson, L. D., Potter, A. B., Spain, E. M., Allen, M. J., and Hill, M. G., Langmuir 14(24), 6781 (1998).
Zhou, D. J., Sinniah, K., Abell, C. and Rayment, T., Langmuir 18(22), 8278 (2002).
Zhao, J. W. and Uosaki, K., Langmuir 17(25), 7784 (2001).
Wold, D. J. and Frisbie, C. D., J. Am. Chem. Soc. 123(23), 5549 (2001).
Wold, D. J. and Frisbie, C. D., J. Am. Chem. Soc. 122(12), 2970 (2000).
Leatherman, G., Durantini, E. N., Gust, D., Moore, T. A., Moore, A. L., Stone, S., Zhou, Z., Rez, P., Liu, Y. Z., and Lindsay, S. M., J. Phys. Chem. B 103(20), 4006 (1999).
Rawlett, A. M., Hopson, T. J., Nagahara, L. A., Tsui, R. K., Ramachandran, G. K., and Lindsay, S. M., Appl. Phys. Lett. 81(16), 3043 (2002).
Sugimura, H., Okiguchi, K., Nakagiri, N., and Miyashita, M., J. Vac. Sci. Technol. B 14(6), 4140 (1996).
Sugimura, H. and Nakagiri, N., Langmuir 11(10), 3623 (1995).
Zheng, J. W., Zhu, Z. H., Chen, H. F., and Liu, Z.-F., Langmuir 16(10), 4409 (2000).
Li, Q. G., Zheng, J. W., and Liu, Z.-F., Langmuir 19(1), 166 (2003).
Kim, S. M., Ahn, S. J., Lee, H., and Kim, E. R., Ultramicroscopy 91(1–4), 165 (2002).
Ara, M., Graaf, H., and Tada, H., Appl. Phys. Lett. 80(14), 2565 (2002).
Xia, Y. N., Mrksich, M., Kim, E., and Whitesides, G. M., J. Am. Chem. Soc. 117(37), 9576 (1995).
Koide, Y., Such, M. W., Basu, R., Evmenenko, G., Cui, J., Dutta, P., Hersam, M. C., and Marks, T. J., Langmuir 19(1), 86 (2003).
Jun, Y., Le, D., and Zhu, X. Y., Langmuir 18(9), 3415 (2002).
Hurley, P. T., Ribbe, A. E., and Buriak, J. M., J. Am. Chem. Soc. 125(37), 11334 (2003).
Ginger, D. S., Zhang, H., and Mirkin, C. A., Angew. Chem. Int. Ed. 43(1), 30 (2004).
Piner, R. D. and Mirkin, C. A., Langmuir 13(26), 6864 (1997).
Hong, S. H., Zhu, J., and Mirkin, C. A., Langmuir 15(23), 7897 (1999).
Piner, R. D., Zhu, J., Xu, F., Hong, S., and Mirkin, C. A., Science 283, 661 (1999).
Hong, S. H., Zhu, J., and Mirkin, C. A., Science 286(5439), 523 (1999).
Liu X., F. L., Hong S., Dravid V. P., Mirkin C. A., Adv. Mater. 14(3), 231 (2002).
Lee, K. B., Park, S. J., Mirkin, C. A., Smith, J. C., and Mrksich, M., Science 295(5560), 1702 (2002).
Smith, J. C., Lee, K. B., Wang, Q., Finn, M. G., Johnson, J. E., Mrksich, M., and Mirkin, C. A., Nano Lett. 3(7), 883 (2003).
Rozhok, S., Piner, R., and Mirkin, C. A., J. Phys. Chem. B 107(3), 751 (2003).
Schwartz, P. V., Langmuir 18(10), 4041 (2002).
Sheehan, P. E. and Whitman, L. J., Phys. Rev. Lett. 88(15) (2002).
Gorman, C. B., Carroll, R. L., He, Y. F., Tian, F., and Fuierer, R. R., Langmuir 16(15), 6312 (2000).
Zamborini, F. P. and Crooks, R. M., J. Am. Chem. Soc. 120(37), 9700 (1998).
Weiss, P. S., Bumm, L. A., Dunbar, T. D., Burgin, T. P., Tour, J. M., and Allara, D. L., Ann. N. Y. Acad. Sci 852, 145 (1998).
Gorman, C. B., Carroll, R. L., and Fuierer, R. R., Langmuir 17(22), 6923 (2001).
Fuierer, R. R., Carroll, R. L., Feldheim, D. L., and Gorman, C. B., Adv. Mater. 14(2), 154 (2002).
Zhao, J. W. and Uosaki, K., Nano Lett. 2(2), 137 (2002).
Xu, S. and Liu, G.-Y., Langmuir 13(2), 127 (1997).
Xu, S., Laibinis, P. E., and Liu, G.-Y., J. Am. Chem. Soc. 120(36), 9356 (1998).
Browning-Kelley, M. E., Wadu-Mesthrige, K., Hari, V., and Liu, G.-Y., Langmuir 13(2), 343 (1997).
Wadu-Mesthrige, K., Xu, S., Amro, N. A., and Liu, G.-Y., Langmuir 15(25), 8580 (1999).
Xu, S., Miller, S., Laibinis, P. E., and Liu, G.-Y., Langmuir 15(21), 7244 (1999).
Marrian, C. R. K., Perkins, F. K., Brandow, S. L., Koloski, T. S., Dobisz, E. A., and Calvert, J. M., Appl. Phys. Lett. 64(3), 390 (1994).
Maoz, R., Frydman, E., Cohen, S. R., and Sagiv, J., Adv. Mater. 12(10), 725 (2000).
Tao, N. J., Phys. Rev. Lett. 76(21), 4066 (1996).
Credo, G. M., Boal, A. K., Das, K., Galow, T. H., Rotello, V. M., Feldheim, D. L., and Gorman, C. B., J. Am. Chem. Soc. 124(31), 9036 (2002).
Wassel, R. A., Credo, G. M., Fuierer, R. R., Feldheim, D. L., and Gorman, C. B., J. Am. Chem. Soc. 126, 295 (2004).
Lewis, M. S. and Gorman, C. B., J. Phys. Chem. B 108, 8581 (2004).
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2007 Springer Science+Business Media, LLC
About this chapter
Cite this chapter
Williams, J.A., Lewis, M.S., Gorman, C.B. (2007). Patterned Self-Assembled Monolayers via Scanning Probe Lithography. In: Kalinin, S., Gruverman, A. (eds) Scanning Probe Microscopy. Springer, New York, NY. https://doi.org/10.1007/978-0-387-28668-6_35
Download citation
DOI: https://doi.org/10.1007/978-0-387-28668-6_35
Publisher Name: Springer, New York, NY
Print ISBN: 978-0-387-28667-9
Online ISBN: 978-0-387-28668-6
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)