Abstract
Many fields of study require deformation measurements of tiny specimens or tiny regions of larger specimens. The mechanics of microelectronic assemblies is an example, where the ever increasing demand for closer packing exacerbates the problems of thermal stresses. Other fields include crack-tip analyses in fracture mechanics; grain and intragranular deformations of metals and ceramics; interface problems; etc. Moiré interferometry adapted for such micromechanics studies is the subject of this chapter.
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References
B. Han and D. Post, “Immersion Interferometer for Microscopic Moiré Interferometry,” Experimental Mechanics, Vol. 32, No. 1, pp. 38–41 (1992).
B. Han, “Higher Sensitivity Moiré Interferometry for Micromechanics Studies,” Optical Engineering, Vol. 31, No. 7, pp. 1517–1526 (1992).
V. T. Chitnis, Y. Uchida, K. Hane and S. Hattori, “Moiré Signals in Reflection,” Optics Communications, Vol. 54, No. 4, pp. 207–211 (1985).
S. Hattori, Y. Uchida and V. T. Chitnis, “An Automatic Super-accurate Positioning Technique Using Moiré Interference,” Bulletin Japan Society of Precision Engineering, Vol. 20, No. 2, pp. 73–78 (1986).
T. W. Shield and K.-S. Kim, “Diffraction Theory of Optical Interference Moiré and a Device for Production of Variable Virtual Reference Gratings: A Moiré Microscope,” Experimental Mechanics, Vol. 31, No. 23, pp. 126–134 (1991).
B. Han, “Interferometric Methods with Enhanced Sensitivity by Optical/Digital Fringe Multiplication,” Applied Optics, Vol. 32, No. 25, pp. 4713–4718 (1993).
P. Hariharan, “Quasi-heterodyne Hologram Interferometry,” Optical Engineering, Vol. 24, No. 4, pp. 632–638 (1985).
R. Dandliker and R. Thalmann, “Heterodyne and Quasi-heterodyne Holographic Interferometry,” Optical Engineering, Vol. 24, No. 5, pp. 824–831 (1985).
J. B. Brownell and R. J. Parker, “Automated Fringe Analysis for Moiré Interferometry,” Proc. 2nd International Conference on Photomechanics and Speckle Metrology, Vol. 1554B, pp. 481–492, SPIE, Bellingham, Washington (1991).
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© 1994 Springer-Verlag New York, Inc.
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Post, D., Han, B., Ifju, P. (1994). Microscopic Moiré Interferometry: Very High Sensitivity. In: High Sensitivity Moiré. Mechanical Engineering Series. Springer, New York, NY. https://doi.org/10.1007/978-1-4612-4334-2_5
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DOI: https://doi.org/10.1007/978-1-4612-4334-2_5
Publisher Name: Springer, New York, NY
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