Skip to main content

Raster Scan Technology Opens New Frontiers for the Microimaged Engineering Drawing

  • Chapter
Advances in CAD/CAM
  • 123 Accesses

Abstract

Engineering drawings stored on aperture cards are scanned by a new 3500 element CCD (Charge Coupled Device). The image, now in digital form, is delivered to a printer/plotter for full size recovery. The scanner-printer link may be a standard data cable or the compressed image may be transmitted via modem, microwave, or satellite for delivery anywhere in the world.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 129.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 169.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 169.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 1984 Kluwer Academic Publishers

About this chapter

Cite this chapter

Boyd, G.N. (1984). Raster Scan Technology Opens New Frontiers for the Microimaged Engineering Drawing. In: Wang, P.CC. (eds) Advances in CAD/CAM. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-2819-3_8

Download citation

  • DOI: https://doi.org/10.1007/978-1-4613-2819-3_8

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4612-9783-3

  • Online ISBN: 978-1-4613-2819-3

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics