Abstract
Several of the techniques that now are well established in the science and technology of surface studies are due essentially to the efforts of a single school. So it is with multiple-beam interferometry, whose application to the study of microtopography stems from the work of Tolansky and his associates(1) the method is unique in its sensitivity and simplicity, providing as it does enormous vertical magnification by the use of only the simplest standard optical components. But multiple-beam interferometry is not yet a widely used tool in surface science, probably because a high degree of experimental skill is needed to fully exploit its potential. This outline is intended as an introduction to the method, which is briefly compared and contrasted with alternative techniques.
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References
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© 1974 Plenum Press, New York
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Hall, A.C. (1974). Multiple-Beam Interferometry. In: Kane, P.F., Larrabee, G.B. (eds) Characterization of Solid Surfaces. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-4490-2_3
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DOI: https://doi.org/10.1007/978-1-4613-4490-2_3
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4613-4492-6
Online ISBN: 978-1-4613-4490-2
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