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In-Situ Field Emission of Carbon Nanotubes

  • Chapter
Electron Microscopy of Nanotubes

Abstract

Carbon nanotubes possess various superior properties for use as field emitters, such as sharp tips with a nanometer-scale radius of curvature [1], high mechanical stiffness [2–4], high chemical stability [5], and unique electrical properties [6, 7]. Due to the unique tip geometry of the carbon nanotubes, their field emission property is one of the most attractive application [8], which has been extensively studied using the classical technique. In this chapter, we introduce a few novel applications of TEM in characterizing the field emission properties of carbon nanotubes, with a focus on the characteristics of individual carbon nanotubes.

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Author information

Authors and Affiliations

  1. Georgia Institute of Technology, Atlanta, GA, 30332-0245, USA

    Z. L. Wang

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  1. Z. L. Wang
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Editors and Affiliations

  1. Center for Nanotechnology and Nanoscience School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA, USA

    Zhong Lin Wang

  2. Department of Materials Science and Engineering, Shanghai Jiaotong University, Shanghai, China

    Chun Hui

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© 2003 Kluwer Academic Pulishers

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Wang, Z.L. (2003). In-Situ Field Emission of Carbon Nanotubes. In: Wang, Z.L., Hui, C. (eds) Electron Microscopy of Nanotubes. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-0315-6_8

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  • DOI: https://doi.org/10.1007/978-1-4615-0315-6_8

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4615-0314-9

  • Online ISBN: 978-1-4615-0315-6

  • eBook Packages: Springer Book Archive

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