Abstract
It is the purpose of this paper to review the problems and possibilities offered by EXAFS studies of materials at high pressures. This is a new field for which high pressure techniques must be refined. Cell designs and methods of measuring the pressure in situ which we have used are indicated. It will be seen that we are currently concerned with the accuracy in measuring bond lengths as a function of pressure and, learning what EXAFS can tell us about pressure-induced structural or electronic phase changes.
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Ingalls, R., Tranquada, J.M., Whitmore, J.E., Crozier, E.D., Seary, A.J. (1981). Extended X-Ray Absorption Fine Structure Studies at High Pressure. In: Teo, B.K., Joy, D.C. (eds) EXAFS Spectroscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-1238-4_8
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DOI: https://doi.org/10.1007/978-1-4757-1238-4_8
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