Abstract
A quick glance through this chapter indicates that it is short but that it is mainly of a mathematical nature. However, it is not as difficult as it seems.
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Intensities are on absolute scale if the amplitudes of the structure factors ∣F∣ =i are expressed in electrons.
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© 1999 Springer Science+Business Media New York
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Drenth, J. (1999). Average Reflection Intensity and Distribution of Structure Factor Data. In: Principles of Protein X-ray Crystallography. Springer Advanced Texts in Chemistry. Springer, New York, NY. https://doi.org/10.1007/978-1-4757-3092-0_5
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DOI: https://doi.org/10.1007/978-1-4757-3092-0_5
Publisher Name: Springer, New York, NY
Print ISBN: 978-1-4757-3094-4
Online ISBN: 978-1-4757-3092-0
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