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Qualitative and Semiquantitative Analysis

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Introduction to X-Ray Spectrometric Analysis
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Abstract

Qualitative analysis is the detection or identification of the constituent elements in the sample, semiquantitative analysis is the estimation of their approximate concentrations, and quantitative analysis is the accurate determination of their concentrations. (The common expression quantitative determination is redundant because a determination is necessarily quantitative.) In any of these three types of analysis, the interest may be in all constituent elements or only one or more specified elements.

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Suggested Reading

  • Adler, I., X-Ray Emission Spectrography in Geology, Elsevier, Amsterdam (1966); pp. 79–88.

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  • Bertin, E. P., Principles and Practice of X-Ray Spectrometric Analysis, 2nd ed., Plenum Press, New York; Chap. 10, pp. 435-457.

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  • Jenkins, R., Introduction to X-Ray Spectrometry, Heyden, London (1974); Chap. 5, pp. 99–106.

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X-Ray Spectrometer Tables

  • Anonymous, X-Ray Wavelengths for Spectrometer, 5th ed., Diano Corp., Industrial X-Ray Division, Woburn, Mass. (1969).

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  • Johnson, G. G., Jr., and E. W. White, “X-Ray Emission Wavelengths and keV Tables for Nondiffractive Analysis,” ASTM Data Series DS-46, American Society for Testing and Materials, Philadelphia (1970).

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  • Powers, M. C, X-Ray Fluorescent Spectrometer Conversion Tables for Topaz, LiF, NaCl, EDDT, and ADP Crystals, Philips Electronic Instruments, Inc., Mount Vernon, N.Y. (1957).

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  • White, E. W., and G. G. Johnson, Jr., “X-Ray Emission and Absorption-Edge Wavelengths and Interchange Settings for LiF-Geared, Curved-Crystal Spectrometers,” Special Publication 1–70, Earth and Mineral Sciences Experiment Station, Pennsylvania State University, University Park, Pa. (1970).

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  • White, E. W., and G. G. Johnson, Jr., “X-Ray Emission and Absorption Wavelengths and Two-Theta Tables,” 2nd ed., ASTM Data Series DS-37A, American Society for Testing and Materials, Philadelphia (1970).

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  • White, E. W., G. V. Gibbs, G. G. Johnson, Jr., and G. R. Zechman, Jr., “X-Ray Emission and Absorption Wavelengths and Two-Theta Tables,” ASTM Data Series DS-37, American Society for Testing and Materials, Philadelphia (1965

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© 1978 Springer Science+Business Media New York

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Bertin, E.P. (1978). Qualitative and Semiquantitative Analysis. In: Introduction to X-Ray Spectrometric Analysis. Springer, Boston, MA. https://doi.org/10.1007/978-1-4899-2204-5_7

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  • DOI: https://doi.org/10.1007/978-1-4899-2204-5_7

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-0-306-31091-1

  • Online ISBN: 978-1-4899-2204-5

  • eBook Packages: Springer Book Archive

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