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Large Scale Application Response Time Measurement Using Image Recognition and Deep Learning

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Advances in Visual Computing (ISVC 2018)

Abstract

Application response time is a critical performance metric to assess the quality of software products. It is also an objective metric for user experience evaluation. In this paper, we present a novel method named CVART (Computer Vision–based Application Response Time measurement) for measuring the response time (latency) of an application. In our solution, we use image recognition and deep learning techniques to capture visible changes in the display of the device running the application to compute the application response time of an operation that triggers these visual changes. Appling CVART can bring multiple benefits compared to traditional methods. First, it allows measuring the response time that reflects a real user experience. Second, the solution enables the measurement of operations that are extremely hard or impossible to measure when using traditional methods. Third, it does not require application instrumentation, which is infeasible in many use cases. Finally, the method does not depend on any specific application or software platform, which allows building performance measurement and application monitoring tools that work on multiple platforms and on multiple devices. For demonstration, we present one use case of applying CVART to measure the application response time of virtual desktops hosted in the cloud or datacenter, and we evaluate its efficiency on measurement at large scale.

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Acknowledgements

The authors would like to thank Juan Garcia-Rovetta and Bruce Herndon, Julie Brodeur for their support of this work.

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Correspondence to Lan Vu .

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Vu, L., Kurkure, U., Sivaraman, H., Bappanadu, A. (2018). Large Scale Application Response Time Measurement Using Image Recognition and Deep Learning. In: Bebis, G., et al. Advances in Visual Computing. ISVC 2018. Lecture Notes in Computer Science(), vol 11241. Springer, Cham. https://doi.org/10.1007/978-3-030-03801-4_45

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  • DOI: https://doi.org/10.1007/978-3-030-03801-4_45

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-030-03800-7

  • Online ISBN: 978-3-030-03801-4

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