Optimization of Physico-Topological Parameters of Dual Energy X-ray Detectors Applied in Inspection Equipment

Abstract

The optimization problem of physico-topological parameters of dual energy detectors used in X-ray security systems was solved. The three-level detector “the first silicon photodiode scintillator/X-ray filter/the second silicon photo diode scintillator” was considered. The main goal of the research was to determine the structural parameters of dual-energy X-ray detectors, ensuring maximum discrimination of materials by atomic number in the area of greatest interest: household materials, explosives and drugs. To solve the multiparameter multicriteria optimization problem, a standard approach was applied, which consisted in the reduction of this problem to a single-criterion problem where the criterion selected was the ratio of the value of squared signal difference to noise ratio to the value of exposure dose on inspected object, to be maximized.