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Concatenated Path Domain for Dijkstra’s Algorithm Based Ray Tracing to Enhance Computational Areas

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Advances on Broad-Band Wireless Computing, Communication and Applications (BWCCA 2019)

Part of the book series: Lecture Notes in Networks and Systems ((LNNS,volume 97))

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Abstract

This paper provides a simulation method which can apply the Dijkstra’s algorithm (DA) based ray tracing to a large size of random rough surface (RRS). Since the RRS and path concatenations are performed, we can deal with this difficult problem even with a small size of personal computer (PC). By using the convolution method to generate 3D RRSs, concatenation of two adjacent RRSs is possible by keeping the random variables with respect to the 2D conjunction area between them. Concatenation of traced rays can also be executed by keeping the path data at the 2D conjunction area. First we start ray tracing for the first RRS with a source node, and next, keeping the 2D path data at the conjunction area, we move to the second RRS to execute ray tracing. We repeat this procedure until ray tracing for the last RRS is finished. All paths computed by the present method constitute shortest paths. However, the shortest paths thus obtained are different from the optical rays, and consequently three path modifications, path-linearization, path-selection and line of sight (LOS)-check, are required. Numerical examples reveal that the proposed concatenation method is an effective tool for a small size of PC to execute ray tracing along a large scale of RRS.

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References

  1. Dijkstra, E.W.: A note on two problems in connexion with graphs. Numerische Mathematlk 1, 269–271 (1959)

    Article  MathSciNet  Google Scholar 

  2. Deo, N.: Graph Theory with Applications to Engineering and Computer Science, pp. 268–327. Prentice-Hall Inc, Englewood Cliffs (1974). ISBN 0-13-363473-6

    MATH  Google Scholar 

  3. Zhan, F.B., Noon, C.E.: Shortest path algorithms: an evaluation using real road networks. Transp. Sci. 32(1), 65–73 (1998). https://doi.org/10.1287/trsc.32.1.65

    Article  MATH  Google Scholar 

  4. Schuster, S.A.: An Introduction to the Theory of Optics. E. Arnold, London (1904). Chapter III

    MATH  Google Scholar 

  5. Uchida, K., Nogami, S., Takematsu, M., Honda, J.: Tsunami simulation based on dijkstra algorithm. In: 2014 International Conference on Network-Based Information Systems, pp. 114–119. Salerno, Italy (2014)

    Google Scholar 

  6. Uchida, K.: Discrete ray tracing based on Dijkstra Algorithm for diffraction and reflection. Int. J. Microwave Opt. Technol. 10(6), 377–384 (2015)

    Google Scholar 

  7. Wu, Y., Li, X.: Numerical simulation of the propagation of hydraulic and natural fracture using Dijkstra’s Algorithm. Energies 9, 519 (2016). https://doi.org/10.3390/en9070519

    Article  Google Scholar 

  8. Uchida, K., Barolli, L.: Dijkstra-Algorithm based ray-tracing by controlling proximity node mapping. In: IEEE 31st International Conference on Advanced Information Networking and Applications Workshops (IEEE WAINA 2017), Taipei, Taiwan, pp.189-194, March 2017

    Google Scholar 

  9. Uchida, K., Leonard, B.: Dijkstra Algorithm based ray tracing: a case study for tunnel structures. In: The 32nd IEEE International Conference on Advanced Information Networking and Applications, AINA 2018, Cracow, Poland, May 2018

    Google Scholar 

  10. Thoros, E.I.: The validity of the Kirchhoff approximation for rough surface scattering using a Gaussian roughness spectrum. J. Acoust. Soc. Am. 83(1), 78–92 (1988)

    Article  Google Scholar 

  11. Uchida, K., Takematsu, M., Lee, J.H., Shigetomi, K., Honda, J.: An analytic procedure to generate inhomogeneous random rough surface. In: The 16th International Conference on Network-Based Information Systems, NBiS 2013, pp. 494–501, Gwangju, Korea (2013)

    Google Scholar 

  12. Hata, M.: Empirical formula for propagation loss in land mobile radio services. IEEE Trans. Veh. Technol. VT–29(3), 317–325 (1980)

    Article  Google Scholar 

  13. Okumura, Y., et al.: Field strength and its variability in UHF and VHF land-mobile radio service. Rev. Elec. Commun. Lab. 16, 825–873 (1986)

    Google Scholar 

  14. Uchida, K.: Path loss along random rough surface in terms of propagation order of distance. In: 8th Asia-Pacific Conference of Antenna and Propagation (APCAP2019), Incheon, Korea (2019)

    Google Scholar 

  15. Noble, B.: Methods Based on the Wiener-Hopf Technique. Pergamon Press, London (1958)

    MATH  Google Scholar 

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Correspondence to Kazunori Uchida .

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Uchida, K., Barolli, L. (2020). Concatenated Path Domain for Dijkstra’s Algorithm Based Ray Tracing to Enhance Computational Areas. In: Barolli, L., Hellinckx, P., Enokido, T. (eds) Advances on Broad-Band Wireless Computing, Communication and Applications. BWCCA 2019. Lecture Notes in Networks and Systems, vol 97. Springer, Cham. https://doi.org/10.1007/978-3-030-33506-9_55

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  • DOI: https://doi.org/10.1007/978-3-030-33506-9_55

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-030-33505-2

  • Online ISBN: 978-3-030-33506-9

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