Abstract
Statistical feature-based pattern recognition approach has been proved to be useful in digital image forgery detection. In this paper, we first present this approach adopted in Phase 1 of the first IEEE IFS-TC Image Forensics Challenge, in which the task is to classify the tampered images from the original ones, together with the experimental results. Several different kinds of statistical features and their combinations have been tested. Finally, we have chosen to use co-occurrence matrices calculated from the rich model of noise residual images. Furthermore we have selected a subset of the rich model to further enhance the testing accuracy by about 2 % so as to reach a high detection accuracy of 93.7 %. In Phase 2 of the competition, the task is to localize the tampered regions by identifying the tampered pixels. For this purpose, we have introduced the Hamming distance of Local Binary Patterns as similarity measure to tackle the tampering without post-processing on copy-moved regions. The PatchMatch algorithm has been adopted as an efficient search algorithm for block-matching. We have also applied a simple usage of the scale-invariant feature transform (SIFT) when other kinds of processing such as rotation and scaling have been performed on the copy-moved region. The achieved f-score in identifying tampered pixels is 0.267. In summary, some success has been achieved apparently. However, much more efforts are called for to move image tampering detection ahead.
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Xu, G., Ye, J., Shi, YQ. (2015). New Developments in Image Tampering Detection. In: Shi, YQ., Kim, H., Pérez-González, F., Yang, CN. (eds) Digital-Forensics and Watermarking. IWDW 2014. Lecture Notes in Computer Science(), vol 9023. Springer, Cham. https://doi.org/10.1007/978-3-319-19321-2_1
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