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Spectroscopic Characterisation of Multiferroic Interfaces

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Spectroscopy of Complex Oxide Interfaces

Part of the book series: Springer Series in Materials Science ((SSMATERIALS,volume 266))

Abstract

In this chapter we discuss the capabilities of X-ray photoemission and absorption spectroscopies for the investigation of the electronic, magnetic and electric properties of multiferroic materials and heterostructures. As complementary techniques providing element selective information on both occupied and empty states, their combination delivers a comprehensive picture of the chemical state of individual species, magnetic moments, bulk and surface band structure, and local atomic environment at the interface between dissimilar materials. By directly probing the electronic structure at the atomic level, unique insights can be learned about the mechanisms responsible for the magnetoelectric couplings in this fascinating class of materials.

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Notes

  1. 1.

    However, due to electronic hybridisation of the final 3p states with 3d states in the magnetic transition metals, pre-edge features may contain magnetic information, and in fact, the first experimental observation of the XMCD effect was at the Fe K edge [166], where the largest spin asymmetry is observed just below the main absorption edge.

  2. 2.

    The low angle of incidence typical of XPEEM implies that s-polarised light is fully in the plane of the sample, while p-polarised light has a dominant out of plane component. The latter geometry has associated with it a natural linear dichroic contribution due to the break of symmetry at the interface (in particular, taking into account the surface sensitivity of PEEM).

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Acknowledgements

We are very thankful to the authors that allowed reproduction of their work here. M.-A.H. was supported by the Swiss Excellence Scholarship Grant ESKAS-No. 2015.0257 and in part by the Romanian UEFISCDI Agency under Contract No. PN-II-ID-JRP-2011-2.

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Husanu, MA., Vaz, C.A.F. (2018). Spectroscopic Characterisation of Multiferroic Interfaces. In: Cancellieri, C., Strocov, V. (eds) Spectroscopy of Complex Oxide Interfaces. Springer Series in Materials Science, vol 266. Springer, Cham. https://doi.org/10.1007/978-3-319-74989-1_10

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