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Q-controlled Dynamic Force Microscopy in Air and Liquids

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Applied Scanning Probe Methods V

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Author information

Authors and Affiliations

  1. Center for NanoTechnology (CeNTech), Heisenbergstr. 11, 48149, Münster

    Hendrik Hölscher & Daniel Ebeling

  2. Department of Mechanical Engineering, Yale University, P.O. Box 208284, New Haven, CT, 06520-8284, USA

    Udo D. Schwarz

Authors
  1. Hendrik Hölscher
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  2. Daniel Ebeling
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  3. Udo D. Schwarz
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Editor information

Editors and Affiliations

  1. Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM) W390 Scott Laboratory, The Ohio State University, 201W. 19th Avenue, Columbus, Ohio, 43210-1142, USA

    Bharat Bhushan

  2. Department of Mathematics, Osaka City University, Graduate School of Science, Sugimoto 3-3-138, 558-8585, Osaka, Japan

    Satoshi Kawata

  3. Center for Nanotechnology (CeNTech) and Institute of Physics, University of Münster, Gievenbecker Weg 11, 48149, Münster, Germany

    Harald Fuchs

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© 2007 Springer-Verlag Berlin Heidelberg

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Hölscher, H., Ebeling, D., Schwarz, U.D. (2007). Q-controlled Dynamic Force Microscopy in Air and Liquids. In: Bhushan, B., Kawata, S., Fuchs, H. (eds) Applied Scanning Probe Methods V. NanoScience and Technology. Springer, Berlin, Heidelberg . https://doi.org/10.1007/978-3-540-37316-2_4

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