Abstract
This paper presents a deterministic test pattern generator structure design based on genetic algorithm. The test pattern generator is composed of a linear register and a non-linear combinational function. This is very suitable solution for on-line built-in self-test implementations where functional units are tested in their idle cycles. In contrast to conventional approaches our multi-objective approach reduces the gate count of built-in self-test structure by concurrent optimization of multiple parameters that influence the final solution.
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Papa, G., Garbolino, T., Novak, F. (2008). Deterministic Test Pattern Generator Design. In: Giacobini, M., et al. Applications of Evolutionary Computing. EvoWorkshops 2008. Lecture Notes in Computer Science, vol 4974. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-78761-7_21
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DOI: https://doi.org/10.1007/978-3-540-78761-7_21
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