Skip to main content

Recipe Generation from Small Samples: Incorporating an Improved Weighted Kernel Regression with Correlation Factor

  • Conference paper
Software Engineering and Computer Systems (ICSECS 2011)

Abstract

The cost of the experimental setup during the assembly process development of a chipset, particularly the under-fill process, can often result in insufficient data samples. In INTEL Malaysia, for example, the historical chipset data from an under-fill process consist of only a few samples. As a result, existing machine learning algorithms cannot be applied in this setting. To solve this problem, predictive modeling algorithm called Weighted Kernel Regression with correlation factor (WKRCF), which is based on Nadaraya-Watson kernel regression (NWKR), is proposed. The correlation factor reflected the important features by changing the bandwidth of the kernel as a function of the output. Even though only four samples are used during the training stage, the WKRCF provides an accurate prediction as compared with other techniques including the NWKR and the artificial neural networks with back-propagation algorithm (ANNBP). Thus, the proposed approach is beneficial for recipe generation in an assembly process development.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 84.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. Fowler, J.W.: Modeling and Analysis of Semiconductor Manufacturing. Dagstuhl Seminar (2002)

    Google Scholar 

  2. Kuan, Y.W., Chew, L.C., Jau, L.W.: Method for proposing sort screen thresholds based on modeling etest/sort-class in semiconductor manufacturing. In: Automation Science and Engineering, CASE 2008, pp. 236–241. IEEE, Los Alamitos (2008)

    Chapter  Google Scholar 

  3. Yip, W., Law, K., Lee, W.: Forecasting Final/Class Yield Based on Fabrication Process E-Test and Sort Data. In: Automation Science and Engineering, CASE 2007, pp. 478–483. IEEE, Los Alamitos (2007)

    Chapter  Google Scholar 

  4. Lee, W., Ong, S.: Learning from small data sets to improve assembly semiconductor manufacturing processes. In: 2nd ICCAE 2010, pp. 50–54 (2010)

    Google Scholar 

  5. Huang, C., Moraga, C.: A diffusion-neural-network for learning from small samples. International Journal of Approximate Reasoning 35, 137–161 (2004)

    Article  MathSciNet  MATH  Google Scholar 

  6. Zhou, J., Huang, J.: Incorporating priori knowledge into linear programming support vector regression. In: Computing and Integrated Systems (ICISS), pp. 591–595. IEEE, Los Alamitos (2010)

    Google Scholar 

  7. Graczyk, M., Lasota, T., Telec, Z., Trawiński, B.: Nonparametric statistical analysis of machine learning algorithms for regression problems. In: Setchi, R., Jordanov, I., Howlett, R.J., Jain, L.C. (eds.) KES 2010. LNCS, vol. 6276, pp. 111–120. Springer, Heidelberg (2010)

    Chapter  Google Scholar 

  8. Shapiai, M., Ibrahim, Z., Khalid, M., Jau, L., Pavlovich, V.: A Non-linear Function Approximation from Small Samples Based on Nadaraya-Watson Kernel Regression. In: 2nd International Conference on Computational Intelligence, Communication Systems and Networks (CICSyN 2010), pp. 28–32. IEEE, Los Alamitos (2010)

    Chapter  Google Scholar 

  9. Bloch, G., Lauer, F., Colin, G., Chamaillard, Y.: Support vector regression from simulation data and few experimental samples. Information Sciences 178, 3813–3827 (2008)

    Article  Google Scholar 

  10. Sun, Z., Zhang, Z., Wang, H.: Incorporating prior knowledge into kernel based regression. Acta Automatica Sinica 34, 1515–1521 (2008)

    Article  MathSciNet  Google Scholar 

  11. Andonie, R., Fabry-Asztalos, L., Abdul-Wahid, C., Abdul-Wahid, S., Barker, G., Magill, L.: Fuzzy ARTMAP prediction of biological activities for potential HIV-1 protease inhibitors using a small molecular dataset. IEEE IEEE/ACM Transactions on Computational Biology and Bioinformatics (2009)

    Google Scholar 

  12. Lanouette, R., Thibault, J., Valade, J.: Process modeling with neural networks using small experimental datasets. Computers & Chemical Engineering 23, 1167–1176 (1999)

    Article  Google Scholar 

  13. Watson, G.: Smooth regression analysis. Sankhy: The Indian Journal of Statistics, Series A 26, 359–372 (1964)

    MathSciNet  MATH  Google Scholar 

  14. Nadaraya, È.: On estimating regression. Teoriya Veroyatnostei i ee Primeneniya 9, 157–159 (1964)

    MATH  Google Scholar 

  15. Jang, M., Cho, S.: Observational Learning Algorithm for an Ensemble of Neural Networks. Pattern Analysis & Applications 5, 154–167 (2002)

    Article  MathSciNet  MATH  Google Scholar 

  16. Isaksson, A., Wallman, M., Göransson, H., Gustafsson, M.: Cross-validation and bootstrapping are unreliable in small sample classification. Pattern Recognition Letters 29, 1960–1965 (2008)

    Article  Google Scholar 

  17. Zhang, J., Huang, X., Zhou, C.: An improved kernel regression method based on Taylor expansion. Applied Mathematics and Computation 193, 419–429 (2007)

    Article  MathSciNet  MATH  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2011 Springer-Verlag Berlin Heidelberg

About this paper

Cite this paper

Shapiai, M.I., Ibrahim, Z., Khalid, M., Wen Jau, L., Ong, SC., Pavlovich, V. (2011). Recipe Generation from Small Samples: Incorporating an Improved Weighted Kernel Regression with Correlation Factor. In: Mohamad Zain, J., Wan Mohd, W.M.b., El-Qawasmeh, E. (eds) Software Engineering and Computer Systems. ICSECS 2011. Communications in Computer and Information Science, vol 179. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-22170-5_13

Download citation

  • DOI: https://doi.org/10.1007/978-3-642-22170-5_13

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-22169-9

  • Online ISBN: 978-3-642-22170-5

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics