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Scanning Tunneling Microscopy and Spectroscopy of Graphene

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Graphene Nanoelectronics

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Abstract

Scanning tunneling microscopy (STM) and spectroscopy (STS) are powerful tools that can reveal the intrinsic properties of the masslesss Dirac fermions in graphene. In particular in the presence of a magnetic field STS gives direct access to the unique sequence of quantized Landau levels providing evidence of the chiral nature of the Dirac fermions and their ultrarelativistic spectrum. A twist between graphene layers gives rise to moiré patterns viewed in STM and to Van Hove singularities in the density of states obtained with STS, which enables direct comparison between structure and electronic properties. STM/STS in graphene on SiO2 provide valuable information about trapped charges, ripples, and other defects. Furthermore, STM can be used to manipulate graphene at nanometer scale.

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Support for this work was provided by DOE, NSF and Lucent.

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  1. Department of Physics & Astronomy, Rutgers University, Piscataway, New Jersey, 08854, USA

    Guohong Li & Eva Y. Andrei

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  1. , Electrical and Computer Engineering, University of Iowa, IATL 116, IOWA City, 52246, USA

    Hassan Raza

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Li, G., Andrei, E.Y. (2011). Scanning Tunneling Microscopy and Spectroscopy of Graphene. In: Raza, H. (eds) Graphene Nanoelectronics. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-22984-8_3

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