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F-Measure Maximization in Topical Classification

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Rough Sets and Current Trends in Computing (RSCTC 2012)

Part of the book series: Lecture Notes in Computer Science ((LNAI,volume 7413))

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Abstract

The F-measure, originally introduced in information retrieval, is nowadays routinely used as a performance metric for problems such as binary classification, multi-label classification, and structured output prediction. In this paper, we describe our methods applied in the JRS 2012 Data Mining Competition for topical classification, where the instance-based F-measure is used as the evaluation metric. Optimizing such a measure is a statistically and computationally challenging problem, since no closed-form maximizer exists. However, it has been shown recently that the F-measure maximizer can be efficiently computed if some properties of the label distribution are known. For independent labels, it is enough to know marginal probabilities. An algorithm based on dynamic programming is then able to compute the F-measure maximizer in cubic time with respect to the number of labels. For dependent labels, one needs a quadratic number (with respect to the number of labels) of parameters for the joint distribution to compute (also in cubic time) the F-measure maximizer. These results suggest a two step procedure. First, an algorithm estimating the required parameters of the distribution has to be run. Then, the inference algorithm computing the F-measure maximizer is used over these estimates. Such a procedure achieved a very satisfactory result in the JRS 2012 Data Mining Competition.

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Cheng, W., Dembczyński, K., Hüllermeier, E., Jaroszewicz, A., Waegeman, W. (2012). F-Measure Maximization in Topical Classification. In: Yao, J., et al. Rough Sets and Current Trends in Computing. RSCTC 2012. Lecture Notes in Computer Science(), vol 7413. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-32115-3_52

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  • DOI: https://doi.org/10.1007/978-3-642-32115-3_52

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-32114-6

  • Online ISBN: 978-3-642-32115-3

  • eBook Packages: Computer ScienceComputer Science (R0)

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