Abstract
This paper investigates on the training of classifiers with highly imbalanced datasets for industrial quality control. The application is on-line process monitoring of laser brazing processes and only a limited amount of data of an imperfection class is available for training. Bayesian adaptation is used to derive a model of the imperfection class from a well sampled model of the class representing a high grade joint surface. For this application, we are able to show that with the sparse training data a performance comparable to a training with a balanced dataset is achievable and even a moderate increase of training data quickly yields a performance gain.
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Grimm, A., Schmidt, M.: Possibilities for online process monitoring at laser brazing based on two dimensional detector systems. In: Proc. 28th Int. Congr. on Applications of Laser & Electro Optics, Orlando, FL, USA (2009)
Akbani, R., Kwek, S., Japkowicz, N.: Applying Support Vector Machines to Imbalanced Datasets. In: Boulicaut, J.-F., Esposito, F., Giannotti, F., Pedreschi, D. (eds.) ECML 2004. LNCS (LNAI), vol. 3201, pp. 39–50. Springer, Heidelberg (2004)
Bishop, C.: Pattern Recognition and Machine Learning. Inf. Science and Statistics. Springer (2006)
Donst, D., Abels, P., Ungers, M., Klocke, F., Kaierle, S.: On-line quality control system for laser brazing. In: Proc. of 28th Int. Congr. on Applications of Laser & Electro Optics, Orlando, FL, USA (2009)
Duda, R., Hart, P., Stork, D.: Pattern Classification, 2nd edn. Wiley-Interscience (2001)
Fecker, D., Maergner, V., Fingscheidt, T.: Online detection of imperfections in laser brazed joints. In: Proc. of the 12th IAPR Conference on Machine Vision Applications (MVA), Nara, Japan, pp. 223–227 (2011)
Fierrez-Aguilar, J., Garcia-Romero, D., Ortega-Garcia, J., Gonzalez-Rodriguez, J.: Bayesian adaptation for user-dependent multimodal biometric authentication. Pattern Recognition 38(8), 1317–1319 (2005)
Kaierle, S., Ungers, M., Franz, C., Mann, S., Abels, P.: Understanding the laser process. Laser Technik Journal 7(7), 49–52 (2010)
Kubat, M., Matwin, S.: Addressing the curse of imbalanced training sets: One-sided selection. In: Proc. of the Fourteenth International Conference on Machine Learning, pp. 179–186. Morgan Kaufmann, San Francisco (1997)
Reynolds, D., Quatieri, T., Dunn, R.: Speaker verification using adapted gaussian mixture models. Digital Signal Processing 10, 19–42 (2000)
Schölkopf, B., Platt, J.C., Shawe-Taylor, J., Smola, A.J., Williamson, R.C.: Estimating the support of a high-dimensional distribution. Neural Computation 13(7) (2001)
Shao, J., Yan, Y.: Review of techniques for on-line monitoring and inspection of laser welding. Journal of Physics: Conference Series 15, 101–107 (1995)
Tarassenko, L., Hayton, P., Cerneaz, N., Brady, M.: Novelty detection for the identification of masses in mammograms. In: Proc. of IEEE Conference on Artifical Neural Networks, Paris, France, pp. 442–447 (1995)
Tax, D.: One-class Classification. Phd thesis, Delft University of Technology, Delft (June 2001)
Tax, D., Duin, R.P.W.: Support vector data description. Machine Learning 54(1), 45–66 (2004)
Ungers, M., Fecker, D., Frank, S., Donst, D., Maergner, V., Abels, P., Kaierle, S.: In-situ quality monitoring during laser brazing. In: Proc. of Laser Assisted Net Shape Engineering 6, Erlangen, Germany, pp. 493–503 (2010)
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Fecker, D., Märgner, V., Fingscheidt, T. (2012). Training of Classifiers for Quality Control of On-Line Laser Brazing Processes with Highly Imbalanced Datasets. In: Pinz, A., Pock, T., Bischof, H., Leberl, F. (eds) Pattern Recognition. DAGM/OAGM 2012. Lecture Notes in Computer Science, vol 7476. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-32717-9_37
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DOI: https://doi.org/10.1007/978-3-642-32717-9_37
Publisher Name: Springer, Berlin, Heidelberg
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